We developed a dual-probe (DP) atomic force microscopy (AFM) system that has two independently controlled probes. The deflection of each cantilever is measured by the optical beam deflection (OBD) method. In order to keep a large space over the two probes for an objective lens with a large numerical aperture, we employed the OBD sensors with obliquely incident laser beams. In this paper, we des...

Microcantilevers modified with a self-assembled monolayer respond sensitively to specific ion concentrations. Here, we report the detection of trace amounts of CrO4(2-) using microcantilevers modified with a self-assembled monolayer of triethyl-12-mercaptododecylammonium bromide. The self-assembled monolayer was prepared on a silicon microcantilever coated with a thin layer of gold on one side....

Dynamic force microscopy (DFM) in combination with special-purpose probe control software is used as a manipulation tool for the precise positioning of single gold nanoparticles on a mica substrate covered with a poly-Llysine film. Experimental results are presented that show how to construct arbitrary patterns of nanoparticles. The dynamic state of the cantilever during the manipulation proces...

In this thesis techniques are developed to read out nanoscale probes and arrays of probes. e main targeted application area is probe-based data storage. e work also contributes to other areas, such as metrology, biological sensing, materials research and nano-electro-mechanical switches. First, an exhaustive literature review of the accomplishments within probe storage is presented. It is found...

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

We present theoretical and experimental results on the mechanical damping of an atomic force microscope cantilever strongly coupled to a self-assembled InAs quantum dot. When the cantilever oscillation amplitude is large, its motion dominates the charge dynamics of the dot which in turn leads to nonlinear, amplitude-dependent damping of the cantilever. We observe highly asymmetric line shapes o...

Cantilever array-based sensor devices widely utilise the laser-based optical deflection method for measuring static cantilever deflections mostly with home-built devices with individual geometries. In contrast to scanning probe microscopes, cantilever array devices have no additional positioning device like a piezo stage. As the cantilevers are used in more and more sensitive measurements, it i...

Abstract Due to the deformability of a microcantilever-based probe, there is an interesting and subtle interplay between probe overtravel, tip skate on surface, ultimate tangency with wafer surface. The relationship these parameters described here. scalable model tested using macroscopic cantilever found be accurate in its predictions. In addition, avoid potential skate-induced damage metallisa...

This paper reports quantitative topographical measurements using a heated atomic force microscope (AFM) cantilever probe. The study compares opographies measured by the cantilever thermal signal to topographies measured by the laser-deflection signal of an AFM system. The experiment sed 20 and 100 nm tall Si gratings as topographical test samples. The cantilever heater temperature ranged from 1...