نتایج جستجو برای: حافظه sram

تعداد نتایج: 6868  

Journal: :IEICE Transactions 2012
Takashi Matsuda Shintaro Izumi Yasuharu Sakai Takashi Takeuchi Hidehiro Fujiwara Hiroshi Kawaguchi Chikara Ohta Masahiko Yoshimoto

One of the most challenging issues in wireless sensor networks is extension of the overall network lifetime. Data aggregation is one promising solution because it reduces the amount of network traffic by eliminating redundant data. In order to aggregate data, each sensor node must temporarily store received data, which requires a specific amount of memory. Most sensor nodes use static random ac...

2010
Kuande Wang

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2014
Chakshu Goel

SRAM occupies two-third area of VLSI chips, therefore it dominates the total power consumption. To enhance the performance of these chips, SRAM cell should meet the requirement of lesser power consumption. This paper presents a new 8T SRAM cell that is efficient in Dynamic power consumption in Write mode and Leakage power consumption when compared with referred 9T SRAM cell and standard 6T SRAM...

2014
Yasuhiro Takahashi Nazrul Anuar Nayan Toshikazu Sekine Michio Yokoyama

In this paper, the authors propose a novel static random access memory (SRAM) that employs the adiabatic logic principle. To reduce energy dissipation, the proposed adiabatic SRAM is driven by two trapezoidal-wave pulses. The cell structure of the proposed SRAM has two high-value resistors based on a p-type metal-oxide semiconductor transistor, a cross-coupled n-type metal-oxide semiconductor (...

2015
R. K. Sah M. kumar

SRAM is a semiconductor memory cell. In this paper, a 10T SRAM cell is designed by using cadence virtuoso tool in 180nm CMOS technology. Its performance characteristics such as power, delay, and power delay product are analysed. 10T SRAM cell is basically 6T SRAM cell with 4 extra transistors. In this 10T SRAM cell, additional read circuitry is attached to avoid flipping of cell. The power diss...

2011
Yohei Nakata Yasuhiro Ito Yasuo Sugure Shigeru Oho Yusuke Takeuchi Shunsuke Okumura Hiroshi Kawaguchi Masahiko Yoshimoto

We propose a fault-injection system (FIS) that can inject faults such as read/write margin failures and soft errors into a SRAM environment. The fault case generator (FCG) generates time-series SRAM failures in 7T/14T or 6T SRAM, and the proposed device model and fault-injection flow are applicable for system-level verification. For evaluation, an abnormal termination rate in vehicle engine con...

2012
Madhurima Kumar Anshul Arora Ritu Arora Neeraj Kr. Shukla P. Bhatnagar S. Birla G. Razavipour A. Afzali-Kusha Rakesh Kumar Singh P. Elakkumanan C. Thondapu

In modern digital architectures, more and more emphasis has been laid on increasing the number of SRAMs in a SoC. However, with the increase in the number of SRAMs, the power requirement also increases, which is not desired. This calls for an urgent need for an SRAM with low dynamic and static power consumption and stability at the same time. The design and simulation work for 6T-SRAM, NC-SRAM,...

2000
B. T. Wang James B. Kuo

This paper reports a two-port 6T CMOS SRAM cell structure for low-voltage VLSI SRAM with single-bit-line simultaneous read-and-write access (SBLSRWA) capability. With a unique structure by connecting the source terminal of an NMOS device in the SRAM cell to the write word line, this SRAM cell can be used to provide SBLSRWA capability for 1V two-port VLSI SRAM as verified by SPICE results.

2016
D. Ane Delphin Ambily Babu

In this paper, we propose a non-volatile SRAM, which presents simultaneously low power dissipation and high speed. This SRAM is based on MRAM (Magnetic RAM technology on standard CMOS. In this non-volatile SRAM design, we use Magnetic Tunnel Junctions (MTJ) as storage element. A 4-bit SRAM cell is designed and its read-write operations are described. Sense Amplifier is used in the read operatio...

2012
Ravi Goel Rajeevan Chandel Dhirendra Kumar

Low threshold voltage and ultra thin oxide become essential in power optimal VLSI circuit design. This paper analyzes the effect of dual thickness and dual threshold on static random access memory (SRAM) leakage power. The different hybrid cell configurations are analyzed for power optimal design of SRAM in 90nm technology node. Cell ratio of SRAM is an essential parameter for area centric SRAM...

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