نتایج جستجو برای: transmission electron microscopy
تعداد نتایج: 604183 فیلتر نتایج به سال:
Using parameter estimation theory, an expression is derived for the maximum precision with which the position of a single atom can be estimated from high resolution transmission electron microscopy images. This expression, being a complicated function of the object as well as of the microscope parameters and the electron dose, can be used to optimize the design of an HREM experiment so as to at...
a green low-cost and reproducible yeast mediated synthesis of silver nanoparticles is reported. the synthesis is performed at room temperature. x-ray and transmission electron microscopy analyses are performed to ascertain the formation of ag nanoparticles. nanoparticles almost spherical in shape having a size of 6-20 nm are found.
the purpose of the current research is investigating the phenylalanine removal by using magnetic nanoparticles (fe3o4) from water samples. the effect of ph, contact time and phenylalanine concentration on phenylalanine adsorption efficiency by magnetite nanoparticles are studied in a batch system. transmission electron microscopy (tem), x-ray diffraction patterns (xrd) and fourier transform inf...
Sn02 nanowires with diameters of 30 — 200 nm have been synthesized by using carbothermalprocess via a thick film of tin dioxide and carbon powder precursor. The nanowires werecharacterized by X-ray power diffraction (XRD), scanning electron microscopy (SEM),transmission electron microscopy (TEM) and Selected Area Electron Diffraction (SAED).The gas sensing characteristic of nanowires toward eth...
Transmission electron microscopy (TEM) is one of the most frequently used tools for the characterization of nanomaterials. Aberration-correction has revolutionized the field of electron microscopy and now equipment is commercially available providing sub-Gngström resolution and single atom sensitivity for atomic, electronic, and chemical structure analyses. In this entry, aberration-corrected s...
Bulk NdNiO3 exhibits a metal-to-insulator transition (MIT) as the temperature is lowered that is also seen in tensile strained films. In contrast, films that are under a large compressive strain typically remain metallic at all temperatures. To clarify the microscopic origins of this behavior, we use position averaged convergent beam electron diffraction in scanning transmission electron micros...
This paper addresses the question as to what extent the incorporation of a monochromator in an electron microscope can enhance the performance of high resolution transmission electron microscopy (HRTEM). The monochromator will reduce the chromatic aberration, and hence the information limit, at the expense of beam current, leading to a decrease in signal intensity and a corresponding decrease i...
A new method of graphene oxide (GO) synthesis via single-step reforming of sugarcane bagasse agricultural waste by oxidation under muffled atmosphere conditions is reported. The strong and sharp X-ray diffraction peak at 2θ = 11.6° corresponds to an interlayer distance of 0.788 nm (d002) for the AB stacked GOs. High-resolution transmission electron microscopy (HRTEM) and selected-area electron ...
Direct-method formalism to determine atomic structures using electron diffraction data is here aimed at a general solution of the phase-retrieval problem, consequently combining electron diffraction (ED) and high-resolution transmission electron microscopy (HRTEM) patterns in a 'domino' fashion. While there are similarities to conventional (kinematical) direct methods, there remain major differ...
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