This paper proposes a novel neural finite-time formation control algorithm for multiple underactuated surface vessels with actuator faults. In the algorithm, leader-follower problem is formulated as two-stage tracking problem. First, to address configuration without information of leader velocity, virtual vessel designed track reference trajectory leader. Second, an adaptive fault-tolerant (AFF...

For the safety and continuity of service in industrial electrical systems, availability transformers is essential. this reason, it necessary to develop intelligent fault diagnosis techniques reduce repair maintenance costs. Recently, several methods have been developed that use artificial intelligence such as neural networks, support vector machines, hybrid techniques, etc., for faults power us...

This paper proposes a method to detect disconnection faults and their exact location in PV systems. The proposed injects multiple frequencies into system with transmitter detects the injected signal using receiver. detected by receiver exhibits different frequency characteristics on failure. Based this characteristic, failure can be detected. In addition, detecting radiated through point, point

The problem of controlling a system in the presence of unknown actuator and sensor faults is addressed. The system is assumed to have groups of actuators, and groups of sensors, with each group consisting of multiple redundant similar actuators or sensors. The types of actuator faults considered consist of unknown actuators stuck in unknown positions, as well as reduced actuator effectiveness. ...

changes in the physicochemical conditions of process unit, even under control, may lead to what are generically referred to as faults. the cognition of causes is very important, because the system can be diagnosed and fault tolerated. in this article, we discuss and propose an artificial neural network that can detect the incipient and gradual faults either individually or mutually. the main fe...

With Moore’s law prediction already reaching its final stages, the number of transistors present in a chip has already touched more than a billion. At this stage, if a chip fails during manufacturing testing, it is becoming highly difficult to diagnose the root cause of the failure with precision. The other major contributing factor to this problem is that the actual defects are always not the ...