نتایج جستجو برای: multiple edge diffraction

تعداد نتایج: 925042  

2002
Peng Zhang P.-S. Kim S. J. Naftel T. K. Sham

Electrochemically deposited CdS nanoparticles (NPs) were formed using porous silicon (PS) as a substrate/electrode. The structure, electronic behavior of the CdS NPs and the interaction between CdS-PS were systematically examined using electron microscope, X-ray diffraction and X-ray absorption fine structure (XAFS) at S K-edge and Si K-edge. The optical luminescence behavior of the nanocomposi...

Journal: :The Journal of chemical physics 2008
E Suljoti M Nagasono A Pietzsch K Hickmann D M Trots M Haase W Wurth A Föhlisch

The evolution of the geometric and electronic structures within the entire series of lanthanide orthophosphate nanoparticles ( approximately 2- approximately 5 nm) has been determined experimentally with X-ray diffraction and near edge X-ray absorption fine structure spectroscopy. In particular, the interplay between electronic structure, crystal morphology, and crystal phase has been systemati...

2000
Xiaojun Dang Aaron M. Massari Joseph T. Hupp

Micropatterned titanium dioxide thin-film electrodes exhibit efficient diffraction in the presence of aqueous or nonaqueous electrolyte solutions. The diffraction efficiency can be modulated electrochemically. At the wavelengths examined, the modulation is caused by changes in both real and imaginary components of the refractive index. The index changes, in turn, are caused by the addition of e...

2001
Steven W. Ellingson

This paper describes a novel antenna array concept in which a “Y”-shaped distribution of elements is used to achieve uniform angle-of-arrival (AOA) measurement performance in azimuth, and a ground plane is employed to reduce the potential for confusion due to scattering from nearby structures and interference from low elevation angles. A simple method for field calibration of this array is also...

2014
Philip J. Withers

We consider whether it is possible to recover the three dimensional strain field tomographically from neutron and X-ray diffraction data for polycrystalline materials. We show that the distribution of strain transverse to a ray cannot be deduced from one diffraction pattern accumulated along that path, but that a certain moment of that data corresponds to the transverse ray transform of the str...

2010
Z. Liliental-Weber D. N. Zakharov K. M. Yu J. W. Ager E. E. Haller H. Lu

Transmission Electron Microscopy and x-ray diffraction were used to study compositional modulation in InxGa1-x N layers grown with compositions close to the miscibility gap. The samples (0.34 < x < 0.8) were deposited by molecular beam epitaxy using either a 200-nm-thick AlN or GaN buffer layer grown on a sapphire substrate. In the TEM imaging mode this modulation is seen as black/white fringes...

2009
A. Gautesen

We have considered a semi-infinite crack embedded in a transversely isotropic medium and studied two special cases, one, in which the axis of symmetry is normal to the crack face and the wave incidence is arbitrary and another, in which the axis lies in the crack plane normal to the edge and the incident wave vector is also normal to the edge. The problem is of interest in Non-Destructive Evalu...

2016
B. Mozer J. Cahn D. Gratias D. Shechtman B. MOZER

Powder neutron diffraction studies were performed on three icosahedral alloys of the aluminum manganese system containing 27, 30. and 34 weight percent manganese. All peaks were found at the angles consistent with the icosahedral indexing with a six-dimensional cubic lattice parameter of approximately 0.65 nm that decreased with increasing Mn content. The relative intensities differ significant...

2002
N. C. Bartelt Ellen D. Williams

We have performed Monte Carlo simulations of the diffraction from simple two-dimensional models of vicinal surfaces in order to aid interpretation of measured diffraction profiles. At low temperature, we find the sharp diffraction features predicted from the analogy of stepped surfaces with two-dimensional incommensurate phases. These sharp features vanish only near the roughening temperature o...

2015
J. Piechowicz

Airborne sound insulation index of the noise barrier panel and the sound absorption coefficient of the barrier surface are the acoustic parameters that are usually determined in specialized laboratories, however they can be also determined in situ. Acoustic characteristics of a barrier include also the diffraction index difference determined from comparison of barriers with plain top edges and ...

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