We know how to use metrology to discover network functional problems and how to measure error rate to detect active or passive abnormal behaviour items. Even, we can use it to observe the network use and to detect abnormal resources consumption. This leads us to develop a flow analyses application to secure networks. Build around a relational data base system, filled by metrology platform and s...

National Institute of Standards and Technology, Gaithersburg, MD 20899-0001 During the manufacturing of presentday integrated circuits, certain measurements must be made of the submicrometer structures composing the device with a high degree of repeatability. Optical microscopy, scanning electron microscopy, and the various forms of scanning probe microscopies are major microscopical techniques...

Atomic processes, that governing the formation of crystalline surface morphology, attracted the considerable attention for possible applications in manufacturing of nanometer scale objects and providing accurate measurements in metrology and calibration techniques. In this paper some new results on the nanostructuring of the atomically clean silicon surface by means of in situ ultrahigh vacuum ...

Vacuum weighing of mass artifacts eliminates the necessity of air buoyancy correction and its contribution to the measurement uncertainty. Vacuum weighing is also an important process in the experiments currently underway for the redefinition of the SI mass unit, the kilogram. Creating the optimum vacuum environment for mass metrology requires careful design and selection of construction materi...

This review paper deals about the main optical NDT (Non-Destructive Testing) method known as, electronic speckle Interferometry. Optical metrology is a field of physics, which includes theoretical and experimental methods to estimate physical parameters, using the light wavelength as fundamental scale. Most of the modern industries need quick and reliable measurement methods for measuring defor...

Nanostructured materials are a new class of materials which provide one of the greatest potentials for improving performance and extended capabilities of products in a number of industrial sectors, including the aerospace, tooling, automotive, electronic, recording, cosmetics, electric motor, duplication, and refrigeration industries. Encompassed by this class of materials are multilayers, nano...

It is well known that classical states of light exhibit shot noise, characteristic of independent or uncorrelated particles. For phase estimation problems, this leads to a shot-noise limited uncertainty of 1/sqrt[N], where N is the number of particles detected. It is also well known that the shot-noise limit is not fundamental: squeezed states and entangled states can be used for sub-shot-noise...

To improve the estimation of active power, the possibility of estimating the amplitude square of a signal component using the interpolation of the squared amplitude discrete Fourier transform (DFT) coefficients is presented. As with an energy-based approach, the amplitude square can be estimated with the squared amplitude DFT coefficients around the component peak and a suitable interpolation a...

Estimating the fundamental frequency and harmonic parameters is basic for signal modelling in a power supply system. Differing from the existing parameter estimation algorithms either in power quality monitoring or in harmonic compensation, the proposed algorithm enables a simultaneous estimation of the fundamental frequency, the amplitudes and phases of harmonic waves. A pure sinusoid is obtai...