In this paper we introduce weighted estimators of the location and dispersion of a multivariate data set with weights based on the ranks of the Mahalanobis distances. We discuss some properties of the estimators like the breakdown point, influence function and asymptotic variance. The outlier detection capacities of different weight functions are compared. A simulation study is given to investi...

A spatial outlier is a spatially referenced object whose non-spatial attribute values are significantly different from the values of its neighborhood. Identification of spatial outliers can lead to the discovery of unexpected, interesting, and useful spatial patterns for further analysis. Previous work in spatial outlier detection focuses on detecting spatial outliers with a single attribute. I...

This paper proposes the method to detect peculiar examples of the target word from a corpus. The peculiar example is regarded as an outlier in the given example set. Therefore we can apply many methods proposed in the data mining domain to our task. In this paper, we propose the method to combine the density based method, Local Outlier Factor (LOF), and One Class SVM, which are representative o...

The problem of detecting outliers in multivariate data sets with continuous numerical features is addressed by a new method. This method combines projections into relevant subspaces archetype analysis nearest neighbor algorithm, through an appropriate ensemble the results. Our able to detect anomaly simple set linear correlation two features, while other methods fail recognize that anomaly. per...

In this paper, we address the problem of visualizing several types of metrics computed on software architecture diagrams. Our specific aim is to present metrics computed on groups of diagram elements, such as classes or components in UML diagrams, together with metrics computed on diagram element members, such as class methods. For member metrics, we use an adapted version of the known table le...

Increased leakage and process variations make distinction between fault-free and faulty chips by IDDQ test difficult. Earlier the concept of Current Ratios (CR) was proposed to screen defective (outlier) chips. However, it is not capable of catching certain defects. Neighboring chips on a wafer have similar fault-free parameters that are correlated through the underlying fabrication process. Ba...

Popular outlier detection methods require the pairwise comparison of objects to compute the nearest neighbors. This inherently quadratic problem is not scalable to large data sets, making multidimensional outlier detection for big data still an open challenge. Existing approximate neighbor search methods are designed to preserve distances as well as possible. In this article, we present a highl...