نتایج جستجو برای: flash calculation

تعداد نتایج: 118882  

2014
Sang Min Yoon Yeon Ju Lee Gang-Joon Yoon Jungho Yoon

We present a novel approach for enhancing the quality of an image captured from a pair of flash and no-flash images. The main idea for image enhancement is to generate a new image by combining the ambient light of the no-flash image and the details of the flash image. In this approach, we propose a method based on Adaptive Total Variation Minimization (ATVM) so that it has an efficient image de...

Journal: :Science 2000
D M Eagleman T J Sejnowski

In the flash-lag illusion, a flash and a moving object in the same location appear to be offset. A series of psychophysical experiments yields data inconsistent with two previously proposed explanations: motion extrapolation (a predictive model) and latency difference (an online model). We propose an alternative in which visual awareness is neither predictive nor online but is postdictive, so t...

Journal: :Applied Thermal Engineering 2022

Thermal conductivity is a fundamental parameter in every battery pack model. It allows for the calculation of internal temperature gradients which affect cell safety and degradation. The accuracy measurement thermal directly proportional to any calculation. Currently industry uses archaic methods measuring this property have errors up 50 %. This includes constituent material approach, Searle’s ...

2011
Haiping Wang

A novel method to extend flash memory lifetime in flash-based DBMS Abstract: As the capacity increases and the price drops gradually, flash memory is becoming the promising replacement of disk, even in the enterprise applications. However, flash memory suffers from erase-before-write and limited write-erase cycles at the same time, which means the abuse of write,especially small and random writ...

Journal: :Vision Research 2006
Joan López-Moliner Daniel Linares

The flash-lag effect (FLE) is defined as an error in localization that consists of perceiving a flashed object to lag behind a moving one when both are presented in physical alignment. Previous studies have addressed the question if it is the predictability of the flash, or the moving object, that modulates the amount of the error. However, the case when the flash is self-generated, and hence c...

Journal: :Symmetry 2018
Van Phi Ho Dong-Joo Park

For the past few years, flash memory has been widely used because of its prominent advantages such as fast access speed, nonvolatility, high reliability, and low power consumption. However, flash memory still has several drawbacks that need to be overcome, e.g., the erase-before-write characteristic and a limited life cycle. Among these drawbacks, the erase-before-write characteristic causes th...

2017
Sergey Hardock Ilia Petrov Robert Gottstein Alejandro P. Buchmann

In the present paper we demonstrate a novel approach to handling small updates on Flash called In-Place Appends (IPA). It allows the DBMS to revisit the traditional write behavior on Flash. Instead of writing whole database pages upon an update in an out-of-place manner on Flash, we transform those small updates into update deltas and append them to a reserved area on the very same physical Fla...

Journal: :CoRR 2015
Ubiratam de Paula Junior Daniel de Oliveira Yuri Frota Valmir Carneiro Barbosa Lúcia Maria de A. Drummond

Cloud computing is a highly scalable computing paradigm where resources are delivered to users on demand via Internet. There are several areas that can benefit from cloud computing and one in special is gaining much attention: the flash-crowd handling. Flash-crowd events happen when servers are unable to handle the volume of requests for a specific content (or a set of contents) that actually r...

Journal: :IEICE Transactions 2012
Ya-Ting Shyu Ying-Zu Lin Rong-Sing Chu Guan-Ying Huang Soon-Jyh Chang

Real-time on-chip measurement of bit error rate (BER) for high-speed analog-to-digital converters (ADCs) does not only require expensive multi-port high-speed data acquisition equipment but also enormous post-processing. This paper proposes a low-cost built-in-self-test (BIST) circuit for high-speed ADC BER test. Conventionally, the calculation of BER requires a high-speed adder. The presented ...

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