Articles you may be interested in Terahertz, optical, and Raman signatures of monolayer graphene behavior in thermally reduced graphene oxide films J. Terahertz transmission and sheet conductivity of randomly stacked multi-layer graphene Appl. Optical investigation of reduced graphene oxide by spectroscopic ellipsometry and the band-gap tuning Appl.

Amorphous gallium oxide thin films were grown by plasma-enhanced atomic layer deposition on (100) silicon substrates from trimethylgallium Ga(CH3)3 precursor and oxygen plasma. At 200 °C, the growth per cycle is in range of 0.65–0.70 Å for O2 plasma exposure times ranging 3 up to 30 s during each cycle. The effect interfacial SiOx regrowth electrical properties was investigated. In situ spectro...

Effects of devitrification in metallic glasses are particular interest for their utilization various applications as the phase transformation from amorphous to crystalline state is known significantly change properties. In this work, we study effect on optical properties using spectroscopic ellipsometry technique. Ellipsometry measurements isothermally crystallized samples at controlled tempera...

Article Ellipsometry and polarimetry – classical measurement techniques with always new developments, concepts, applications was published on September 1, 2022 in the journal Advanced Optical Technologies (volume 11, issue 3-4).

Among the various biomarkers that are used to diagnose or monitor disease, extracellular vesicles (EVs) represent one of the most promising targets in the development of new therapeutic strategies and the application of new diagnostic methods. The detection of circulating platelet-derived microvesicles (PMVs) is a considerable challenge for laboratory diagnostics, especially in the preliminary ...

1. The permittivities obtained by the spectroscopic ellipsometry (SE850) The permittivities are obtained by the spectroscopic ellipsometry (SE850). The following Table. S1 shows the experimental parameters for determination the permittivities of Cr, PR and Ag. Table. S1 Measurement the perimittivities with ellipsometry 2. Optimizing the thickness of film The thicknesses of Cr, PR and Ag are mai...

Refractive index (RI) is a complex number comprising a real refractive index and an imaginary part: the absorption (or extinction) coefficient. The analysis of refractive index by the Surfoptic Imaging Reflectometer yields an approximation to the real part of the refractive index. The well established technique of ellipsometry, by contrast, can determine both the real refractive index and the e...

Constant-psi constant-delta contour maps in the reduced angle-of-incidence-film-thickness plane that are useful in ellipsometry and in design of reflection-type optical devices are discussed. As a specific example, a contour map is given for the SiO(2)-Si film-substrate system at the 6328-A He-Ne laser wavelength.

For the first time, cobalt oxide films that are highly protective against localized corrosion and depicting a wide variety of bright and uniform colors due to light interference, have been successfully electrogenerated on polycrystalline cobalt disk electrodes under potentiostatic polarization in a mild aqueous bicarbonate medium. Open circuit potential measurements have shown the formation of ...