نتایج جستجو برای: dual faults
تعداد نتایج: 179082 فیلتر نتایج به سال:
We present a novel approach for model-based FDI of abrupt faults in process components of continuous dynamic systems. Abrupt faults refer to parameter value changes that occur much faster than the nominal process dynamics, and component faults refer to faults that correspond to physical parameters in the bond graph model of a system. These faults cause transients in system behavior. We analyze ...
We investigate two strategies to guarantee temporal correctness of a combinational circuit. We first propose a new technique to identify and test primitive faults. A primitive fault is a path delay fault that has to be tested to guarantee the performance of the circuit. Primitive faults can consist of single(SPDF’s) or multiple-path delay faults (MPDF’s). Testing strategies for single primitive...
The problem of fault tolerance in cooperative manipulators rigidly connected to an undeformable load is addressed in this paper. Four categories of faults are considered: free-swinging joint faults (FSJFs), locked joint faults (LJFs), incorrectly measured joint position faults (JPFs), and incorrectly measured joint velocity faults (JVFs). Free-swinging and locked joint faults are detected via a...
Geological forces shape the earth’s crust. Normal faults, for example, form when extensional forces pull blocks of rock apart along a plane, whereas reverse faults are formed by compressional forces. Geologists classify faults to retrace the forces that have acted on an area; however, normal and reverse faults often look similar. In this study we investigated whether viewing superficially simil...
We investigate fault-tolerant routing schemes which aim at using low number of virtual channels in wormhole-routed mesh networks. The faults under consideration are rectangular block faults, which are suitable for modeling faults on board level in networks with grid structures. There is no restriction on the number of faults. The concepts of f-ring and f-chain are used in our scheme. Messages a...
This paper presents single-cell dynamic fault models for deep-submicron semiconductor memories together with their associated tests (test primitives). The test primitives are evaluated industrially, together with the traditional tests, using 65nm technology 131 Kbytes embedded SRAMs. A comparison between static faults and dynamic faults is presented and the results are reported; they show the i...
A turn fault in the stator winding of a generator causes a large circulating current to flow in the shorted turns. If left undetected, turn faults can propagate, leading to phaseground or phase-phase faults. Incipient detection of turn’s faults is essential to avoid hazardous operating conditions and reduce down time. At present the synchronous generators are protected against almost all kind o...
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