The effect of film thickness on the structural- and electrical-properties is investigated in Co 2 FeAl 0.5 Si (CFAS) thin films thickness, t, range 12–75 nm. These are grown by ultrahigh vacuum dc magnetron sputtering Si(100) substrates with SiO buffer layer (300 nm), at substrate temperature 500 ◦ C. GIXRD patterns reveal that B2 structural order decreases increasing t. t = 75 nm has sizable A...

We report here an interpretation of the electrical resistivity ~r! below 15 K of two Fe–Cr multilayers ~30 layers of 20 Å Fe/10 and 12 Å Cr! produced by Xe ion-beam sputter deposition. These multilayers have a negative giant magnetoresistance ~GMR! of ;21% at 4.2 K and Hsat 513 kOe. Very high-resolution resistance measurements ~better than 3 ppm! were made down to 2.3 K at every (100610) mK. Ex...

LaCrSb3, a new layered material, crystallizes in space group Pbcm with a ) 13.266(3), b ) 6.188(1), and c ) 6.100(1) Å at 293 K as determined by neutron diffraction. Corrugated CrSb2 layers are stacked normal to [100] and are separated by La3+ ions and a nearly square planar Sb layer. Resistivity data indicate metallic behavior parallel to the c-axis. At low temperatures, the resistivity follow...

Instability of slopes, embankments, and cuttings on the railway network is increasingly prevalent globally. Monitoring vulnerable infrastructure aids in geotechnical asset management, improvements to transport safety efficiency. Here, we examine use a novel, near-real-time Electrical Resistivity Tomography (ERT) monitoring system for assessing stability cutting Leicestershire, United Kingdom. I...