Formant trajectories of five American English diphthongs embedded in the target words BAIT (/ei/), BITE (/ai/), POUT (/au/), BOAT (/Ou/), BOYS (/oi/) are investigated in the F1-F2 space as a function of age and gender. Age range considered is from 5 to 18 years. In this report, the focus is given to the differences in position between the start/end points of diphthongs and nine monophthons. Ave...

One of the tenets of equilibrium asset pricing models is that expected return of an asset is positively related to its risk (price variability of the asset). In other words, it is expected that assets with higher expected returns are also the ones with higher risk, or assets with lower risk are the ones with lower expected returns. The logic behind this idea is actually is simple and intuitive:...

The built environment is among the critical factors in older adults’ travel behavior, and a favorable can encourage them to engage various activities. Existing studies have mostly focused on exploring correlation between ignoring heterogeneity two at different times of day. In this study, we conducted structured, face-to-face interviews Nanjing (China) metropolitan area investigate time consume...

The boundary of urban built-up areas is the baseline data a city. Rapid and accurate monitoring prerequisite for control layout spaces. In recent years, night light satellite sensors have been employed in area extraction. However, existing extraction methods not fully considered properties that directly reflect areas, like land surface temperature. This research first converted multi-source int...

The main aim of this paper is to design and implement efficient UART and test the UART with built in self testing technique . A new Test pattern generator is simulated and used in BIST architecture in order to reduce power dissipation. As we know that power dissipation is more during the test mode than in normal mode hence In this project the pattern generator used is the low power pattern gene...

Increasing number of pins or gates in the latest LSI’s requires a lot of testing resources. The conventional scan-based testing requires a costly tester (ATE) equipped with a lot of pin electronics. Since reducing the testing cost is a crucial issue in industry, we have introduced an approach using scan-based logic BIST to solve this problem. The logic BIST has applied to many ASIC design chips...