X-ray photoelectron spectroscopy (XPS) depth profiling with C60(+) sputtering was used to resolve the lithium-ion distribution in the nanometer-scale domain structures of block polymer electrolyte thin films. The electrolytes of interest are mixtures of lithium trifluoromethanesulfonate and lamellar-forming polystyrene-poly(oligo(oxyethylene)methacrylate) (PS-POEM) copolymer. XPS depth profilin...

CP titanium was polished with a colloidal silica suspension and chromic oxide slurry under low and high pressures. The polished surfaces were characterized by means of EPMA and XPS. Irrespective of polishing pressure, colloidal silica suspension successfully created a mirror-like surface that was clean at EPMA level. However, XPS detected a small amount of silicon on the outermost surface. On t...

Photoelectron spectroscopy (PES) is one of the most established methods for determining the elemental composition and the chemical state of solid surfaces and thin films. This experiment focuses on X-ray Photoelectron Spectroscopy (XPS), which exploits Xray photons to excite electrons from the core levels of the atoms of a solid into the vacuum, thus probing the electronic structure of matter w...

The possibility that strongly correlated many–electron systems may exhibit spin–charge separation has generated great excitement, particularly in the light of recent experiments on low dimensional conductors and high temperature superconductors. However, finding experimental support for this hypothesis has been made difficult by the fact that most commonly used probes couple simultaneously to s...

The copper nitride surface characteristics according to atmospheric pressure plasma (APP) and excimer ultraviolet (EUV) treatment were compared using XPS and AFM. As the result of XPS analysis result, in C1s, the organic material removal effect was greater for EUV treatment than for APP, and the oxygen content was found to be low. In Cu (933 eV) area, the shoulder peak of Cu compound was detect...