نتایج جستجو برای: x ray diffractometry

تعداد نتایج: 664824  

2008
M. Bhaskaran S. Sriram

Conditions for depositing perovskite-oriented Pb0.92Sr0.08(Zr0.65Ti0.35) O3 thin films on gold by RF magnetron sputtering are investigated. Deposition results were analysed by scanning electron microscopy, X-ray photoelectron spectroscopy and X-ray diffractometry. It was found that the desired perovskite phase can be obtained at a substrate temperature of 300 C, much lower than the typically re...

Journal: :Acta Crystallographica Section A Foundations of Crystallography 1993

Journal: :Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering 2015

Journal: :Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering 2015

Journal: :Acta Crystallographica Section A Foundations of Crystallography 1993

Journal: :Journal of Physics D: Applied Physics 1993

Journal: :Acta Crystallographica Section A Foundations of Crystallography 2005

Journal: :The Journal of chemical physics 2004
Peter A Beckmann Carol Paty Elizabeth Allocco Maria Herd Carolyn Kuranz Arnold L Rheingold

We report x-ray diffractometry in a single crystal of 2-t-butyl-4-methylphenol (TMP) and low-frequency solid state nuclear magnetic resonance (NMR) proton relaxometry in a polycrystalline sample of TMP. The x-ray data show TMP to have a monoclinic, P2(1)/c, structure with eight molecules per unit cell and two crystallographically inequivalent t-butyl group (C(CH(3))(3)) sites. The proton spin-l...

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید