This paper outlined a feature-based inspection process planning system for co-ordinate measuring machines (CMMs). The inspection process planning system is designed to produce an inspection process planning directly from CAD model. The prototype inspection process planning system includes ®ve functional modules: the tolerance feature analysis, accessibility analysis, clustering algorithm, path ...

We present a novel inspection framework to detect dirt and blemish in production line of optical fabrication automatically. To detect dirt defect from vignette surface, we use B-Spline to generate an ideal vignette surface and subtract the contaminated surface from the generated vignette surface to locate the defect. Besides, we apply some image processing methods to optimize our inspection fra...

The configuration of a surface inspection vision system as a complex task, requires mining associations among attributes due to the variability of the surface and the environment in real-time production process. The surface inspection task has to change to deal with different elements such as, wood, stainless steel or paper inspection and, in the case of stainless steel, with reflectance and th...

This paper focuses on the task of automatic visual inspection of color uniformity on the surface of integrated circuits (IC) wafers arising from the layering process. The oxide thickness uniformity within a given wafer with a desired target thickness is of great importance for modern semiconductor circuits with small oxide thickness. The non-uniform chemical vapor deposition (CVD) on a wafer su...