The discovery of genomic structural variants (SVs), such as copy number variants (CNVs), is essential to understand genetic variation of human populations and complex diseases. Over recent years, the advent of new high-throughput sequencing (HTS) platforms has opened many opportunities for SVs discovery, and a very promising approach consists in measuring the depth of coverage (DOC) of reads al...

Statistical Models for Analyzing Human Genetic Variation by Sriram Sankararaman Doctor of Philosophy in Computer Science and the Designated Emphasis in Computational and Genomic Biology University of California, Berkeley Professor Michael I. Jordan, Chair Advances in sequencing and genomic technologies are providing new opportunities to understand the genetic basis of phenotypes such as disease...

A statistical metrology framework is used to identify systematic and random sources of interconnect structure (ILD thickness) variation. Electrical and physical measurements, TCAD simulations, design of experiments, signal processing, and statistical analysis are integrated via statistical metrology to deconvolve ILD thickness variation into constituent variation sources. In this way, insight i...

As parametric variation increases in importance with shrinking dimensions and increasing integration, the need to understand and manage such variation is becoming critical. Statistical metrology is a collection of tools and techniques for the systematic characterization and study of variation in semiconductor manufacturing. In addition to methods for collecting large volumes of data, important ...