نتایج جستجو برای: sims

تعداد نتایج: 3637  

2016
H. Werner A. Von Rosenstiel H. W. Werner

Different modes of SIMS for thin film analysis and the principle of SIMS will be discussed; this will be followed by a discussion of some features related to instrumentation: types of ion sources and their characteristics; ion microprobe versus ion microscope; special modes of SIMS: sputter neutral mass spectrometry (SNMS) and fast atom bombardment. (FAB). The discussion of analytical features ...

Journal: :زن در توسعه و سیاست 0
مسعود کوثری عضو هیات علمی گروه ارتباطات، دانشکده علوم اجتماعی دانشگاه تهران

this article deals with the social and family values in one of the most famous simulation games (the sims) in the recent years. it is tried to answer some questions, whether, the sims is a representative of social values of american society, and in particular, of the american family. what is the cement of the american society from the game point of view? what does the sims family suggest as a m...

2007
Rosa Mikeal Martey Jennifer Stromer-Galley

can be found at: Games and Culture Additional services and information for http://gac.sagepub.com/cgi/alerts Email Alerts: http://gac.sagepub.com/subscriptions Subscriptions: http://www.sagepub.com/journalsReprints.nav Reprints: http://www.sagepub.com/journalsPermissions.nav Permissions: http://gac.sagepub.com/cgi/content/refs/2/4/314 SAGE Journals Online and HighWire Press platforms): (this ...

M. Turinici

The xed point result in Mustafa-Sims metrical structures obtained by Karapinar and Agarwal[Fixed Point Th. Appl., 2013, 2013:154] is deductible from a corresponding one stated in terms ofanticipative contractions over the associated (standard) metric space.

ایان میچل, , محمد بلوریزاده, ,

  We have initiated a study to extract concentration profiles of ultra shallow phosphorous implants in silicon complementing published work on ultra shallow boron implant profiles. There is an ever-increasing interest in the production of p-n junctions in silicon to create the new generations of ultra large scale integrated (ULSI) devices. Such junctions can be formed by implantation do pants (...

2016
Amir Saeid Mohammadi Nhu T.N. Phan John S. Fletcher Andrew G. Ewing

We have investigated the capability of nanoparticle-assisted laser desorption ionization mass spectrometry (NP-LDI MS), matrix-assisted laser desorption ionization (MALDI) MS, and gas cluster ion beam secondary ion mass spectrometry (GCIB SIMS) to provide maximum information available in lipid analysis and imaging of mouse brain tissue. The use of Au nanoparticles deposited as a matrix for NP-L...

2018
Lothar Veith Julia Böttner Antje Vennemann Daniel Breitenstein Carsten Engelhard Jan Meijer Irina Estrela-Lopis Martin Wiemann Birgit Hagenhoff

The increasing use of nanoparticles (NP) in commercial products requires elaborated techniques to detect NP in the tissue of exposed organisms. However, due to the low amount of material, the detection and exact localization of NP within tissue sections is demanding. In this respect, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Ion Beam Microscopy (IBM) are promising techniques...

2007
L. R. Sheppard A. J. Atanacio T. Bak J. Nowotny K. E. Prince

Secondary ion mass spectrometry (SIMS) is a powerful technique in the study of materials that demonstrate compositional changes as a function of depth from the surface. This is due to the high chemical sensitivity of SIMS (sensitive to ppb) and potential for high depth resolution. However, as a semi-quantitative technique, the application of SIMS to quantitative studies can be problematic witho...

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