نتایج جستجو برای: shaped cantilever
تعداد نتایج: 76604 فیلتر نتایج به سال:
Due to its simplicity, the parallel beam approximation (PBA) is commonly used in the analytical evaluation of the spring constant of V-shaped atomic force microscope (AFM) cantilevers. However, the point of contention regarding the validity of the PBA is as yet an unresolved issue, which has been exacerbated by some recent contradictory reports. In this paper, we present a detailed investigatio...
MEMS are used in acceleration, flow, pressure and force sensing applications on the micro macro levels. The fundamental part of every sensor is transducer which converts measurend intrest into interpretable output signal. most prominent piezoresistive cantilever translates any signal an electrical signal.This paper presents deisgn fabrication U shaped with enhanced sensitivity stiffness gives b...
On an AgNO3 crystal, an equilateral or a right-angle triangle-shaped Ag trimer was selectively fabricated through near-field photo-reduction and observed in situ by using an apertured cantilever coupled with an atomic force microscope. By using the different triangle-shaped Ag trimers, irradiation wavelength and polarization dependence of surface-enhanced Raman scattering were investigated.
The present study investigates the effects of thermal conduction and convection on self-heating temperatures and bimetallic deflections produced in doped microcantilever sensors. These cantilevers are commonly used as sensors and actuators in microsystems. The cantilever is a monolith, multi-layer structure with a thin U-shaped element inside. The cantilever substrate is made of silicon and sil...
We present in-depth discussion of the design and optimization of a nanomechanical sensor using a silicon cantilever comprising a two-dimensional photonic crystal (PC) nanocavity resonator arranged in a U-shaped silicon PC waveguide. For example, the minimum detectable strain, vertical deflection at the cantilever end, and force load are observed as 0.0133%, 0.37 mum, and 0.0625 muN, respectivel...
Numerical modelling of atomic force microscopy cantilever designs and experiments is presented with the aim of exploring friction mechanisms at the microscale. As a starting point for this work, comparisons between finite element (FE) models and previously reported mathematical models for stiffness calibration of cantilevers (beam and V-shaped) are presented and discrepancies highlighted. A col...
Micro- and nanocantilevers are increasingly employed as mass sensors. Most studies consider the first flexural mode and adsorbed masses that are either discretely attached or homogeneously distributed along the entire length of the cantilever. We derive general expressions that allow for the determination of the total attached mass with any mass distribution along the cantilever length and all ...
In this work we have proposed an improvement in the shape of the V-shaped microcantilever by varying the width profile. In this paper we have studied the variation of resonant frequency as a function of changes in profile determined by the length of the microcantilever, keeping constant the active area for binding. It is observed that for the optimized nonlinear profile the angle at the tip is ...
Microcantilevers were first introduced as imaging probes in Atomic Force Microscopy (AFM) due to their extremely high sensitivity in measuring surface forces. The versatility of these probes, however, allows the sensing and measurement of a host of mechanical properties of various materials. Sensor parameters such as resonance frequency, quality factor, amplitude of vibration and bending due to...
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