A surface energy induced patterning SEIP method is developed to transfer resist patterns defined by lithography into various functional materials. A Si template is first chemically patterned using conventional lithography and selective attachment of trichlorosilane to achieve spatially different surface energies. Organic materials as well as inorganic films are deposited onto the chemically pat...

We extend to several dimensions the result of K. Seip and Y.I. Lyubarskii that proves the existence of Riesz basis of exponentials for a finite union of intervals with equals lengths.

Kevin D Ballard ([email protected]) Richard S Bruno ([email protected]) Richard L Seip ([email protected]) Erin E Quann ([email protected]) Brittanie M Volk ([email protected]) Daniel J Freidenreich ([email protected]) Diana M Kawiecki ([email protected]) Brian R Kupchak ([email protected]) Min-Yu Chung ([email protected]) William J Kraemer (william.kraeme...

In his 1993 paper [10], Kristian Seip characterizes sampling and interpolation sequences for the space A−n and gives an outline of the proof of the corresponding theorem for the Bergman space A2. Using his techniques, we provide a complete proof of the result concerning sampling sequences not only for A2, but also for Ap, 1 ≤ p < ∞.

It is now well established that pituitary dwarfism may be recessively inherited (Hanhart, 1925; Nowakowski and Lenz, 1961; Trygstad and Seip, 1964; Rimoin, Merimee, and McKusick, 1966). The condition has repeatedly been observed in sibs (Biben and Gordan, 1955; Scharer and Prader, 1960; Nowakowski and Lenz, 1961; Trygstad and Seip, 1964; Bierich, 1964; Brasel, Wright, Wilkins, and Blizzard, 196...

We present explicit estimates for the growth of sine-type-functions as well as for the derivatives at their zero sets, thus obtaining explicit constants in a result of Levin. The estimates are then used to derive explicit lower bounds for exponential Riesz bases, as they arise in Avdonin’s Theorem on 1/4 in the mean or in a Theorem of Bogmér, Horváth, Joó and Seip. An application is discussed, ...