نتایج جستجو برای: nano metrology

تعداد نتایج: 55232  

Journal: :Optics express 2013
N Granzow M A Schmidt W Chang L Wang Q Coulombier J Troles P Toupin I Hartl K F Lee M E Fermann L Wondraczek P St J Russell

Efficient generation of a broad-band mid-infrared supercontinuum spectrum is reported in an arsenic trisulphide waveguide embedded in silica. A chalcogenide "nano-spike", designed to transform the incident light adiabatically into the fundamental mode of a 2-mm-long uniform section 1 µm in diameter, is used to achieve high launch efficiencies. The nano-spike is fully encapsulated in a fused sil...

2008
J. C. Chiao Julian M. Goldman David A. Heck Peter Kazanzides William J. Peine James B. Stiehl Dwight Yen Nicholas G. Dagalakis

With rapid advances in meso-, micro- and nano-scale technology devices and electronics, a new generation of advanced medical devices is emerging, which promises medical treatment that is less invasive and more accurate, automated, and effective. We examined the technological and economic status of five categories of medical devices. A set of metrology needs is identified for each of these categ...

2013
Rusen Yan Qin Zhang Oleg A. Kirillov Wei Li James Basham Alex Boosalis Xuelei Liang Debdeep Jena Curt A. Richter Alan C. Seabaugh David J. Gundlach Huili G. Xing N. V. Nguyen

photoemission from silicon to oxide Rusen Yan (闫汝森), Qin Zhang, Oleg A. Kirillov, Wei Li, James Basham, Alex Boosalis, Xuelei Liang, Debdeep Jena, Curt A. Richter, Alan C. Seabaugh, David J. Gundlach, Huili G. Xing, and N. V. Nguyen Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA Department of Electrical Enginee...

2012
Rusen Yan Qin Zhang Wei Li Irene Calizo Tian Shen Curt A. Richter Angela R. Hight-Walker Xuelei Liang Alan Seabaugh Debdeep Jena Huili Grace Xing David J. Gundlach N. V. Nguyen

semiconductor band alignment by internal photoemission spectroscopy Rusen Yan, Qin Zhang, Wei Li, Irene Calizo, Tian Shen, Curt A. Richter, Angela R. Hight-Walker, Xuelei Liang, Alan Seabaugh, Debdeep Jena, Huili Grace Xing, David J. Gundlach, and N. V. Nguyen Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA Depa...

2016
Farzaneh Fadakar Masouleh Narottam Das Seyed Mohammad Rozati Peter V. Schaeffer

Due to the rising power demand and substantial interest in acquiring green energy from sunlight, there has been rapid development in the science and technology of photovoltaics (PV) in the last few decades. Furthermore, the synergy of the fields of metrology and fabrication has paved the way to acquire improved light collecting ability for solar cells. Based on recent studies, the performance o...

2006
Nasr Ghoniem

The topic of this project belongs to focus area #3 of the NSF solicitation: " Micro/Nanoscale Phenom-enology and Metrology. " Nano-structured materials are extremely attractive for applications requiring high strength and ductility. Two such areas are: (1) nano-layered composites for future aerospace applications demanding high strength-to-weight ratios; and (2) next-generation interconnect and...

Journal: :Journal of the Japan Society for Precision Engineering 2015

2013
Gerardo Adesso

Invited Talks (Alphabetical order) Gerardo Adesso (University of Nottingham, UK) Relativistic Quantum Metrology

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