نتایج جستجو برای: mueller matrix

تعداد نتایج: 367551  

Journal: :Biomedical Optics Express 2019

2006
Shamaraz Firdous Masroor Ikram

The Mueller matrix polarimetry is a useful technique for characterization and imaging of biological materials and turbid medium. The recoded transmitted Mueller matrix elements are highly intensity and wavelength dependent. We derived the sixteen Mueller matrix images out of forty-nine polarization configurations for characterization of the polystyrene sphere of 0.2 to 20 μm illuminated with po...

Journal: :Optics express 2011
Noé Ortega-Quijano José Luis Arce-Diego

Mueller matrix differential decomposition is a novel method for analyzing the polarimetric properties of optical samples. It is performed through an eigenanalysis of the Mueller matrix and the subsequent decomposition of the corresponding differential Mueller matrix into the complete set of 16 differential matrices which characterize depolarizing anisotropic media. The method has been proposed ...

2003
JOSE JORGE

A necessary and sufficient scalar condition for a Mueller matrix M to describe a non-depolarizing optical system is obtained. By computing only one scalar parameter, it can be determined whether a given Mueller matrix M describes a non-depolarizing, or a depolarizing optical system. The following theorem is stated: a necessary and sufficient condition for a given Mueller matrix M to describe a ...

Journal: :Applied optics 2003
Ping Yang Heli Wei George W Kattawar Yong X Hu David M Winker Chris A Hostetler Bryan A Baum

The Mueller matrix (M) corresponding to the phase matrix in the backscattering region (scattering angles ranging from 175 degrees to 180 degrees) is investigated for light scattering at a 0.532-microm wavelength by hexagonal ice crystals, ice spheres, and water droplets. For hexagonal ice crystals we assume three aspect ratios (plates, compact columns, and columns). It is shown that the contour...

Journal: :Journal of Modern Optics 2016

2012
M. Foldyna

We characterized two samples consisting of photoresist layers on silicon with square arrays of square holes by spectroscopic ellipsometry (SE) and Mueller matrix polarimetry (MMP). Hole lateral dimensions and depths were determined by fitting either SE data taken in conventional planar geometry or MMP data in general conical diffraction configurations. A method for objective determination of th...

Journal: :Journal of the Optical Society of America A 2010

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