Among the different types of algorithms proposed to test Static Random Access Memories (SRAMs), March Tests have proven to be faster, simpler and regularly structured. A large number of March Tests with different fault coverage have been published. Usually different march tests detect only a specific set of memory faults. The always growing memory production technology introduces new classes of...

A new approach to automatically generating diagnostic memory tests of linear order (O(N)) is presented. The resulting March tests provide complete detection and distinguishing of all single-cell and two-cell fault models. The approach is based on state transition graph modelling, decomposition of functional memory faults into basic fault effects, and output tracing. For each of the targeted bas...

Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and makes test algorithm design a very complex task. Although several March Tests have been developed for the wide memory faults spread, a few of them are able to detect linked faults. In the present paper March AB, a March Test t...

With increasingly stringent requirements for memory test, the complexity of the test algorithm is increasing. This will make BIST (Build-In-Self-Test) circuit more complex and the area of BIST circuit larger. This paper proposes a novel controllable BIST circuit. The controllable BIST circuit provides a cost-effective solution that supports a variety of March algorithms and SRAM embedded testin...

This paper presents an efficient diagnosis scheme for RAMs. Three March-based algorithms are proposed to diagnose simple functional faults of RAMs. A March-15N algorithm is used for locating and partially diagnosing faults of bit-oriented or word-oriented memories, where N represents the address number. Then a 3N March-like algorithm is used for locating the aggressor words (bits) of coupling f...

The memory blocks testing is a separate testing procedure followed in VLSI testing. The memory blocks testing involves writing a specific bit sequences in the memory locations and reading them again. This type of test is called March test. A particular March test consists of a sequence of writes followed by reads with increasing or decreasing address. For example the March Ctest has the followi...

The increase in integrity of the recent VLSI technology has enabled a trend of a lot of new, small and portable applications. The popularity of these portable applications, for ex notebook computers and cellular phones demand even higher performance and lower-power consumption. Embedded semiconductor memories form a big portion of the overall hardware on these portable devices. Testing the semi...

1. A retrospective, observational, multicenter study evaluated aortic remodeling and associated complications in 47 patients treated with thoracic endovascular aneurysm repair (TEVAR) for blunt traumatic injuries (BTAI). Which of the following is correct?1A.Aortic remodelling more common young patientsB.Aortic occurs mainly during first year after TEVAR its occurrence thereafter rare.C.Aortic c...