Vanadium dioxide (VO₂) thermochromic thin films with various thicknesses were grown on quartz glass substrates by radio frequency (RF)-plasma assisted oxide molecular beam epitaxy (O-MBE). The crystal structure, morphology and chemical stoichiometry were investigated systemically by X-ray diffraction (XRD), atomic force microscopy (AFM), Raman spectroscopy and X-ray photoelectron spectroscopy (...

Determination of The transmittance values measured in IR reflectionabsorption (RA) spectra were used to determine the optical constants of dielectric films laid on solid substrates. In order to obtain the optical constants of polystyrene films laid on steel we used dispersion analysis. In this case, the optical constants are obtained from IR spectrum recorded at a single incidence angle. The us...

We analyze the geometry and electronic structure of a series of amorphous Zn-Ir-O systems using classical molecular dynamics followed by density functional theory taking into account two different charge states of Ir (+3 and  +4). The structures obtained consist of a matrix of interconnected metal-oxygen polyhedra, with Zn adopting preferentially a coordination of 4 and Ir a mixture of coordina...

The most significant process for optical coating is variant of vacuum deposition. Zinc sulphide having direct and large band gap which is use in opto electronics. By using ZnS material in thermal evaporation technique and characterizing the minimum reflectance and maximum transmittance in visible wavelength and energy gap increases with increasing thickness having direct and large band gap. Whe...

The transmittance values measured in IR reflection-absorption (RA) spectra were used to determine the optical constants of dielectric films laid on solid substrates. When the recorded spectra show interference fringes, one can determine the film thickness. The PbSe film thickness was obtained by interpreting the interference fringes from the reflexion-absorption IR spectra recorded at two diffe...

The increasing prevalence of three-dimensional (3D) printing optical housings and mounts necessitates a better understanding the properties materials. This paper describes method for using multithickness samples 3D materials to measure transmittance spectra at wavelengths from 400 2400 nm [visible short-wave infrared (IR)]. In this method, with material thicknesses 1, 2, 3, 4 mm were positioned...

Cadmium oxide (CdO) thin films were deposited on the glass substrate by the modified SILAR method, using cadmium acetate dihydrate and ammonium hydroxide aqueous solution as precursors. The structural, surface morphological, elemental composition and optical properties of the deposited films were investigated via X-Ray Diffraction (XRD), scanning electron microscopy, EDAX,...

The structural and optical characterization of Se-Ge alloys during melt quenching technique was the goal of this study. In this regards, five different samples of Se100-xGex (x= 10, 20, 30, 40, 50) were prepared by conventional melt quenching in quartz ampoule. The produced samples were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM), differential scanning calori...