The recent discovery of ion tracks in interplanetary dust and the increasing evidence for carbon and carburized materials in these objects are strongly suggestive that chemical processing by energetic charged-particle bombardment has occurred during the dust lifetimes. The track density gives a measure of the total ion fluence experienced by the grains. We use this information and laboratory da...

In this study, we used a 30 keV argon cluster ion beam bombardment to investigate the dynamic processes during nano-ripple formation on gold surfaces. Atomic force microscope analysis shows that the gold surface has maximum roughness at an incident angle of 60° from the surface normal; moreover, at this angle, and for an applied fluence of 3 × 1016 clusters/cm², the aspect ratio of the nano-rip...

A detailed mechanism for heteroepitaxial diamond nucleation under ion bombardment in a microwave plasma enhanced chemical vapour deposition setup on the single crystal surface of iridium is presented. The novel mechanism of Ion Bombardment Induced Buried Lateral Growth (IBI-BLG) is based on the ion bombardment induced formation and lateral spread of epitaxial diamond within a ~1 nm thick carbon...

Most vacuum devices are hampered by ion bombardment due to residual gases. Sometimes, it causes the breakdown of devices and shortens their life. In this article, the effect of the ion bombardment on the cathode surface in a structure of a field emission display was simulated. In this structure, a special type of spacer was used, named “hop” and “flu” spacer. The trajectories of electrons emitt...

Bombardment with C60+ primary ions of monolayer and multilayer barium arachidate Langmuir-Blodgett (LB) films is investigated. The behavior of cluster versus atomic (Ga+) bombardment is monitored by the barium-cationized arachidate ion (mass-to-charge ratio (m/z) 449) and a characteristic fragment ion (m/z 209) using 1-, 7-, and 15-layer model systems. The removal rate of material from the film...

Ordered nanodroplet arrays and aligned nanodroplet chains are fabricated using ion-beam-directed self-organization. The morphological evolution of nanodroplets formed on GaAs (100) substrates under ion beam bombardment is characterized by scanning electron microscopy and atomic force microscopy. Ordered Ga nanodroplets are self-assembled under ion beam bombardment at off-normal incidence angles...

Cluster ion bombardment is at the forefront of current ToF-SIMS research, particularly when examining the feasibility of molecular depth profiling and three-dimensional imaging applications. It has become increasingly clear that secondary ion emission after cluster projectile impact results from a radically different sputtering mechanism than the linear collision cascades that dominate after at...

The bombardment of a 26 nm poly(methyl methacrylate) (PMMA) film has been studied as a model for depth profiling of polymeric samples using a newly developed C60 þ ion source. Experiments were conducted on a ToF-SIMS instrument equipped with C60 þand Gaþ ion sources. A focused dc C60 þ ion beam was used to etch through the polymer sample at specified time intervals. Subsequent spectra were reco...

Ion implantation, a common technology in semiconductor processing, has been applied to biomaterials since the 1960s. Using energetic ion bombardment, a general term which includes conventional ion implantation plasma immersion ion implantation (PIII) and ion beam assisted thin film deposition, functionalization of surfaces is possible. By varying and adjusting the process parameters, several su...