Residual stresses of physical vapor deposition (PVD) hard coatings can be measured using X-ray diffraction (XRD) methods under either conventional d-sin2 ψ mode or glancing incident (GIXRD) mode, in which substantial uncertainties exist depending on the applied diffraction parameters. This paper reports systematic research on the effect of the two analytical modes, as well as the anisotropic el...

Using poly(3,4-ethylenedioxythiophene):polystyrene sulfonate (PEDOT:PSS) as hole conductor, a series of inverted planar CH3NH3PbI3-xClx perovskite solar cells (PSCs) were fabricated based on perovskite annealed by an improved time-temperature dependent (TTD) procedure in a flowing nitrogen atmosphere for different time. Only after an optimum annealing time, an optimized power conversion efficie...

The aim of this research was to investigate the influence of metallurgy on the corrosion behaviour of separate weld zone (WZ) and parent plate (PP) regions of X65 pipeline steel in a solution of deionised water saturated with CO2, at two different temperatures (55 °C and 80 °C) and at initial pH~4.0. In addition, a non-electrochemical immersion experiment was also performed at 80 °C in CO2, on ...

Thermal treatment of supersaturated Ti1!xAlxN films (x " 0.67) with a dominant ternary cubic-phase were performed in the 700– 1000 !C range. Grazing incidence X-ray diffraction (GIXRD) shows that, for annealing temperatures up to 800 !C, the film structure undergoes the formation of coherent cubic AlN (c-AlN) and TiN (c-TiN) nanocrystallites via spinodal decomposition and, at higher temperature...

The oxidation behaviour of the pesting-resistant eutectic alloy Mo-20Si-52.8Ti was investigated by addressing microstructural and chemical constitution grazing incidence X-ray diffraction GIXRD atom probe tomography APT oxide scales formed at 800 1200 °C in order to understand their protective character. duplex Si-Ti-oxide scale air, i.e. within so-called “pesting regime”, is considerably slow ...

We studied in-situ the interaction of sodium metal with UO2+x (0 ≤ x 1) using thin films prepared by sputter deposition on Au substrate. X-ray Photoelectron Spectroscopy (XPS) and Grazing Incidence X-Ray Diffraction (GIXRD) characterized before after interaction. The results show that does not reduce stoichiometric UO2 at room temperature. Plasmon loss peaks, observed Na1s photoemission (PE) li...

The technique of grazing incidence X-ray diffractometry (GIXRD) was used to study damaged layers in NaNd(WO4)2 and NaNd(MoO4)2 ceramics irradiated with high-energy ions. possibilities applicability limits the for analysis such samples are shown. Estimates degree amorphization near-surface given depending on irradiation dose. higher resistance external radiation exposure as compared has been dem...

Novel materials suitable for optoelectronics are of great interest due to limited and diminishing energy resources and the movement toward a green earth. We report a simple film growth method to tune the S composition, x from 1 to 2 in semiconductor ultrathin SnSx films on quartz substrates, that is, single phase SnS, single phase SnS2, and mixed phases of both SnS and SnS2 by varying the sulfu...

Thin film metallic glasses undergoing devitrification can form partially crystallized or fully materials with novel structural and magnetic properties. The development of desired tunable properties such systems drives the need to understand mechanism their thermal evolution at atomic level. Co-sputtered amorphous Ni-Zr alloy thin films which were thermally annealed in steps 200 deg C from room ...