نتایج جستجو برای: cause effect
تعداد نتایج: 1974506 فیلتر نتایج به سال:
risks mean cases of uncertainty of project, the impact of which is realized as a threat (negative aspect) and/or opportunity (positive aspect). the traditional viewpoint on risk is a negative viewpoint that implies damages, loss and harmful consequences. judgments such as this on risk merely emphasize on risks management and pay less attention to opportunities management. it is clear that some ...
During four years of on line operation of the SLAC polarized electron gun (PEGGY) and polarized LEED (PLEED) system, we have observed and characterized the failure modes of the GaAs (100) photocathodes (PC’s) used in these systems. Several modes are observed. Gradual decreases in electron polarization and intensity are attributed to the physisorption of CO2 on the PC’s during running at LN2 tem...
A continuum damage model for the prediction of the onset and evolution of intralaminar failure mechanisms and the collapse of structures manufactured in fiber-reinforced plastic laminates is proposed. The failure mechanisms occurring in the longitudinal and transverse directions of a ply are represented by a set of scalar damage variables. Crack closure effects under load reversal are taken int...
Arch-shaped members are widely used for construction of tunnels, bridges, silos and shells. These members are not typically provided with transverse reinforcement and may thus have a brittle behaviour at failure. When subjected to bending or shear, traditional design methods used for straight members are not applicable due to deviation forces developing at the curved chords carrying compression...
The ultimate life of a microelectronics component is often limited by failure of a solder joint due to crack growth through the laminate under a contact pad (cratering), through the intermetallic bond to the pad, or through the solder itself. Whatever the failure mode proper assessments or even relative comparisons of life in service are not possible based on accelerated testing with fixed ampl...
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