Delay testing that requires the application of consecutive two-pattern tests is not an easy task in a scan-based environment. This paper proposes a novel approach to the delay fault testing problem in scan-based sequential circuits. This solution is based on the combination of a BIST structure with a scan-based design to apply delay test pairs to the circuit under test.

Power dissipation during test application is an emerging problem due to yield and reliability concerns. This paper focuses on BIST for RTL data paths and discusses testability trade-offs in terms of test application time, BIST area overhead and power dissipation.

This paper presents a BIST architecture, based on a single micro-programmable BIST Processor and a set of memory Wrappers, designed to simplify the test of a system containing many distributed multi-port SRAMs of different sizes (number of bits, number of words), access protocol (asynchronous, synchronous), and timing.

Article history: Received 29 June 2010 Received in revised form 18 October 2012 Accepted 18 October 2012 Available online 20 November 2012 0045-7906/$ see front matter 2012 Elsevier Ltd http://dx.doi.org/10.1016/j.compeleceng.2012.10.00 q Reviews processed and approved for publication ⇑ Corresponding author. Tel.: +3

A bomb calorimeter is an apparatus used for measuring the performance of coal in term of heat of combustion. Recent awareness has been created regarding uncertainty of measurement, due to mainly two reasons. Laboratory accreditation, which has steadily been on the rise, which requires a estimation of uncertainty of measurement particularly in the field of calibration. Second, increased maturity...

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then detecting if the logic behaved as intended. The main advantage of LBIST is that it provides test capability without an external tester. In particular, safety-critical designs need to be tested and r...