نتایج جستجو برای: based measurement

تعداد نتایج: 3270606  

Journal: :desert 2013
m. nasri s. feiznia m. jafari h. ahmadi

the problems of land degradation and soil loss are among the major problems of watersheds in iran. for erosion andsediment estimation one can use statistical and empirical methods. for doing this, land unit map and the map of effectivefactors should be prepared. for erosion and sediment estimation one can use statistical and empirical methods. however,these empirical methods are usually time co...

Journal: :desert 0
m. nasri assistant professor, islamic azad university of ardestan, ardestan, iran s. feiznia professor, university of tehran, karaj, iran m. jafari professor, university of tehran, karaj, iran h. ahmadi professor, islamic azad university, science and research branch, tehran, iran

the problems of land degradation and soil loss are among the major problems of watersheds in iran. for erosion andsediment estimation one can use statistical and empirical methods. for doing this, land unit map and the map of effectivefactors should be prepared. for erosion and sediment estimation one can use statistical and empirical methods. however,these empirical methods are usually time co...

Journal: :TEACHING Exceptional Children 1987

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه شیراز - دانشکده علوم پایه 1392

a novel and ultra low cost isfet electrode and measurement system was designed for isfet application and detection of hydronium, hydrazinium and potassium ions. also, a measuring setup containing appropriate circuits, suitable analyzer (advantech board), de noise reduction elements, cooling system and pc was used for controlling the isfet electrode and various characteristic measurements. the t...

Journal: :journal of electrical and computer engineering innovations 0
shiva taghipour department of electrical engineering, university of guilan, rasht, iran rahebeh niaraki asli department of electrical engineering, university of guilan, rasht, iran

due to the expected increase of defects in circuits based on deep submicron technologies, reliability has become an important design criterion. although different approaches have been developed to estimate reliability in digital circuits and some measuring concepts have been separately presented to reveal the quality of analog circuit reliability in the literature, there is a gap to estimate re...

Journal: :ACM SIGPLAN Notices 2014

Journal: :International Journal of Approximate Reasoning 2016

Journal: :Measurement Science and Technology 2013

Journal: :Physical Review Letters 2017

Journal: :IEEE Transactions on Pattern Analysis and Machine Intelligence 2004

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