A new atomic force microscope (AFM) that operates in ultrahigh vacuum (UHV) is described. The sample is held fixed with spring clamps while the AMF cantilever and deflection sensor are scanned above it. Thus, the sample is easily coupled to a liquid nitrogen cooled thermal reservoir which allows AFM operation from ≈ 100 K to room temperature. AFM operation above room temperature is also possibl...

Images and force measurements taken by an atomic-force microscope ( AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure u...

a simple method has been employed to synthesize copper and copper oxide nanoparticles from copper (ii) succinate precursor by thermal decomposition method using oleylamine as a capping agent. the particles synthesized with oleylamine and triphenylphosphine were well dispersed nanoparticles obtained from x-ray diffraction (xrd). the synthesized copper nanoparticles were characterized by uv-visib...

The atomic force microscope (AFM) now routinely provides images that reveal subnanometer surface structures of biomolecules. The sensitivity and precision of AFM provide new opportunities for studying the mechanical properties of biomolecules and their interactions in their native environment.

We have developed a dynamic atomic force microscopy (AFM) method based on the simultaneous excitation of the first two flexural modes of the cantilever. The instrument, called a bimodal atomic force microscope, allows us to resolve the structural components of antibodies in both monomer and pentameric forms. The instrument operates in both high and low quality factor environments, i.e., air and...

A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microsc...

We describe studies of the elastic properties and frictional characteristics of graphene samples of varying thickness using an atomic force microscope. For tensile testing, graphene is suspended over micron-sized circular holes and indented by atomic force microscope (AFM) tips. Fitting of the forcedisplacement curves yields the prestress and elastic stiffness, while comparison of the breaking ...

nanoscale science and technology has today mainly focused on the fabrication of nano devices. in this paper, we study the use of lithography process to build the desired nanostructures directly. nanolithography on polymethylmethacrylate (pmma) surface is carried out by using atomic force microscope (afm) equipped with silicon tip, in contact mode. the analysis of the results shows that the dept...

We report on the precise positioning of a carbon nanotube on an atomic force microscope (AFM) tip. By using a nanomanipulator inside a scanning electron microscope, an individual nanotube was retrieved from a metal foil by the AFM tip. The electron beam allows us to control the nanotube length and to sharpen its end. The performance of these tips for AFM imaging is demonstrated by improved late...

An atomic force microscope (AFM) based system has been built for the manipulation of materials at the nanometer scale. The AFM is combined with an inverse optical microscope and an UV-laser microbeam system for photoablation. The actuators of the AFM are controlled using a digital signal processor. Real-time routines and a graphical user interface have been programmed for high resolution imagin...