Accelerated life testing provides an interesting challenge for quantification of the uncertainties involved, in particular due to the required linking of the units’ failure times, or failure time distributions, at different stress levels. This paper provides an initial exploration of the use of statistical methods based on imprecise probabilities for accelerated life testing. We apply nonparame...

In this paper, the test purpose will be to assess whether or not the accelerated model proposed by Eyring will be able to translate results for the shape and scale parameters of an underlying Weibull model, obtained under two accelerating using conditions, to expected normal using condition results for these parameters. The product being analyzed is a new type of insulate fluid, and the acceler...

In accelerated life testing, the nominal life time is often related to stress levels by an acceleration equation. Three particular models that have been used frequently in the past are the power law model, the Arrhenius model and the Eyring model. In this paper we suggest choosing a model from a model family which includes the three particular models as special cases. This family is deened by a...

Channel temperature is a key parameter for accelerated life testing in GaN HEMTs. It is assumed that selfheating is similar in RF and DC operation and that DC test results can be applied to RF operation. We investigate whether this assumption is valid by using an experimentally calibrated, combined electrical and thermal model to simulate Joule heating during RF operation and compare this to DC...

The main objective of accelerated life tests in this setting is the recovery of the distribution of the random variable representing lifetime which is difficult to observe at a certain level of a given stress factor. A general model for accelerated life test is proposed that utilizes the inverse problem approach, that is, the variable is observe at different level/s and the transfer function is...

This paper, determines the confidence interval using the Fisher information under progressive type-II censoring for the k-step exponential step-stress accelerated life testing. We study the performance of these confidence intervals. Finally an example is given to illustrate the proposed procedures.

< p>Accelerated Life Testing (ALT) is very important in evaluating the reliability of highly reliable products. According to ALT procedure, products undergo higher stress levels than normal conditions to reduce the failure times. ALTs have been studied for various conditions and stresses. In addition to common stress such as temperature and humidity, random usage can also be considered as anoth...