Abstract A new approach to optimize a configurable twodimensional (2-D) linear feedback shift registers (LFSR) for both embedded and random test pattern generation in built-in self-test (BIST) is proposed. This configurable 2-D LFSR based test pattern generator generates: 1) a deterministic sequence of test patterns for random-pattern-resistant faults, and then 2) random patterns for random-pat...

In this work, a new method to design a mixedmode Test Pattern Generator (TPG) based only on a simple and single Linear Feedback Shift Register (LFSR) is described. Such an LFSR is synthesized by Berlekamp–Massey algorithm (BMA) and is capable of generating pre-computed deterministic test patterns which detect the hard-to-detect faults of the circuit. Moreover, the LFSR generates residual patter...

LFSR (Linear Feedback Shift Register) is commonly employed in various cryptography applications to generate pseudo-random numbers. The overall number of random state produced by the LFSR is determined by the feedback polynomial. LFSR is a shift register in which some of their outputs are taken in exclusive-OR format that forms the feedback path. So it capable to generate maximum of 2-1 random s...

Feedback Shift Registers (LFSR) is presented here. In this method, shift register structure used for polynomial modular division is combined with LFSR keystream generator to yield a new keystream generator with much higher periodicity. Security is brought into this structure by using the Boolean function to combine state bits of the LFSR keystream generator and taking the output through the Boo...

The sequential circuit designed was Look-Ahead Transformation based LFSR in which a hardware complexity was present and it may limit their employ in many applications. The design of efficient LFSR for BCH encoder using TePLAT (Term Preserving Look-Ahead Transformation) overcame this limitation by opening the employ of minimizing the iteration bound and hardware complexity in wide range of appli...

Filter generators are vulnerable to several attacks which have led to well-known design criteria on the Boolean filtering function. However, Rønjom and Cid have observed that a change of the primitive root defining the LFSR leads to several equivalent generators. They usually offer different security levels since they involve filtering functions of the form F (x) where k is coprime to (2 − 1) a...

The aim of testing of VLSI circuits is high-quality screening of the circuits by targeting performance related faults. A low hardware overhead test pattern generator (TPG) for scan based BIST that can detect the any faults in the circuit under test and analyze their response .It is a new fault coverage test pattern generator using a liner feedback shift register (LFSR) called FC-LFSR can perfor...

The Whole point of cryptography is to solve problems. It solves problems that involve secrecy, authentication ,integrity and dishonest people .A protocol Is a series steps ,involving two or more parties designed accomplish task. A means the has sequence, from start finish. Analyzing stream ciphers often easier than analyzing block ciphers. For example, one important metric used analyze LFSR-bas...

Built-In Self-Test (BIST), as the name suggests is a technique in which the circuit is capable of testing itself. This paper presents two techniques: Linear Feedback Shift Register (LFSR) and Cellular Automata (CA), used for test pattern generation and test response analysis in a typical BIST circuit. Both LFSR and CA are analyzed based on their construction and characteristics. A comparison of...

We present an SoC testing approach that integrates test data compression, T AM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as the compression engine. All cores on the SoC share a single on-chip LFSR. At any clock cycle, one or more cores can simultaneously receive data from the LFSR. Seeds for the LFSR are computed from the care bits from the test cube...