نتایج جستجو برای: transmission electron microscope
تعداد نتایج: 539724 فیلتر نتایج به سال:
Stereological analysis has been coupled with transmission electron microscope (TEM) orientation mapping to investigate the grain boundary character distribution in nanocrystalline copper thin films. The use of the nanosized (<5 nm) beam in the TEM for collecting spot diffraction patterns renders an order of magnitude improvement in spatial resolution compared to the analysis of electron backsca...
A method that enables high precision extraction of transmission electron microscope (TEM) specimens in low contrast materials has been developed. The main idea behind this work is to produce high contrast markers on both sides of and close to the area of interest. The markers are filled during the depositing of the protective layer. The marker material can be of either Pt or C depending on whic...
Environmental transmission electron microscopy and ultra-high resolution electron microscopic observation using aberration correctors have recently emerged as topics of great interest. The former method is an extension of the so-called in situ electron microscopy that has been performed since the 1970s. Current research in this area has been focusing on dynamic observation with atomic resolutio...
Introduction: Since the return to Earth of the Wild 2 comet samples by the Stardust mission, most of the studies have been performed on terminal particles located at the end of the deceleration tracks. However, the major fraction of the cometary material is unevenly distributed along the track walls [1,2]. Particles within samples extracted from the walls show strong collectinduced thermal alte...
Despite the significant advances in the transmission electron microscope (TEM), such as application of aberration correction and monochromation [1], sample preparation is still one of the most critical steps determining the quality, and precision of the results. The important challenge here is to prepare samples that are thin enough for electron transparency, free from any surface damage and al...
The intensity levels in a three-dimensional (3D) reconstruction, obtained by electron tomography, can be influenced by several experimental imperfections. Such artifacts will hamper a quantitative interpretation of the results. In this paper, we will correct for artificial intensity variations by determining the 3D point spread function (PSF) of a tomographic reconstruction based on high angle ...
The imaging process in a transmission electron microscope (TEM) produces a number of artifacts including the contrast transfer function (CTF) and envelope functions. In addition, when electron cryomicroscopy is performed for purposes of single particle reconstruction, signal to noise ratios are very low, generally peaking between 0.1 and 1.0, and averaging 0.01 to 0.1. We apply a semi-empirical...
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