The detectability of delay flaws can be improved by testing CMOS IC's with a very low supply voltage -between 2 and 2.5 times the threshold voltage Vt of the transistors. A delay flaw is a defect that causes a local timing failure but the failure is not severe enough to cause malfunctioning. Delay flaws caused by degraded signals and gates with lower drive capability than expected are considere...

Process variation has more significant impact on circuit performance as technology develops to nano scale. It is therefore necessary to evaluate chip performance using statistical timing analysis rather than deterministic static timing analysis. This paper first evaluates the impact of single extrinsic fluctuation on circuit performance based on the rigorously derived propagation delay model. T...

Gravitational wave detection can be done by precision timing of millisecond pulsars, and (with less likelihood) by precision astrometry on distant objects whose light or radio waves pass through gravitational waves on their way to our observatories. Underlying both of these is the relatively simple theory of light propagation in spacetimes with gravitational waves, which is also the basis of in...

Combinational logic circuit timing analysis is an important issue that all designers need to address. The present paper presents a simple and compact analysis procedure. We follow the guidelines drawn by previous methods, but we shall define new time-dependent logic variables that help us improve their efficiency. By using the methodology suggested, we shall replace a very laborious technique (...

We have correlated a sample of 99 Seyfert 1 & 98 Seyfert 2 (Rafanelli et al., 1995) interacting galaxies with the survey and pointed ROSAT data and have detected 91 Seyferts 1 & 47 Seyfert 2s in the X-ray band. We have performed spectral and timing analysis of the X-ray detected sources, and we have examined the relation of the X-ray luminosity L X with the interaction strength Q.

Real silicon variability characterization and modeling are important topics for statistical timing analysis. In this paper, we describe our RO-array test structures in 65nm process and measurement result of WID and D2D variations. We decompose and characterize WID variability into deterministic, systematic, and random components. We also discuss how these components affect circuit timing analysis.

Dual-Vt technology is effective in leakage reduction and has been implemented in industry EDA tools. However, on-chip temperature is regarded as uniformly distributed over the chip, with a pre-assumed value. This assumption does not hold for designs in the deep sub-micron deomain as on-chip temperature variation becomes more and more significant. As a result, treating temperature as a constant ...

The metazoan genome is replicated in precise cell lineage-specific temporal order. However, the mechanism controlling this orchestrated process is poorly understood as no molecular mechanisms have been identified that actively regulate the firing sequence of genome replication. Here, we develop a mechanistic model of genome replication capable of predicting, with accuracy rivaling experimental ...

In this paper, discontinuous interconnect lines are modelled and analyzed as a cascaded line composed of many uniform interconnect lines. The system transfer functions of respective uniform interconnect lines are determined, followed by its time domain response. Since the time domain response expression is a transcendental form, the waveform expression is reconfigured as an approximated linear ...

Introduction Modeling the activities, knowledge, and requirements of agents (both human and automated) has been recognized as a recurrent theme in research conducted by members of the Software and Systems Technology Area (SSTA) at the Honeywell Technology Center (HTC). In fact, we have formed a special interest group that aims to collate and clarify the broad range of task and agent modeling ex...