In integrated circuit industry, device metrology is crucial to the future development of semiconductor industry. Critical dimension scanning electron microscope (CD-SEM) is used as a tool for the linewidth measurement and critical dimension (CD) metrology. However, the signal intensity in a secondary electron image obtained by CD-SEM is influenced not only by geometry character of specimen but ...

Internal and surface structures of asci and ascospores were studied by transmission electron microscopy (TEM) and by scanning electron microscopy (SEM) to establish the character and number of ascospores within the ascus of Metschnikowia krissii. Enzyme digestion with snail gut enzymes and SEM examination suggested the presence of a single ascospore enclosed in a thick sheath of epiplasmic mate...

We present a fast, novel method for building porous silicon-based silicon-on-insulator photonic crystals in which a periodic modulation of the refractive index is built by alternating different electrochemical etching currents. The morphology and reflectance spectra of the photonic crystals, prepared by the proposed method, are investigated. The scanning electron micrograph and atomic force mic...

The follicle epithelial cells of the thyroid gland from three horses were subjected to x-ray microanalysis to identify directly the distribution of iodine and other elements. The scanning transmission electron micrograph of the thyroid was directly correlated with the distribution of these elements detected by energy dispersive x-ray microanalyzer. Higher level of I, S, P, and Cl was detected i...

Rotational power spectrum analysis of scanning transmission electron micrographs of negatively stained herpesvirus capsids has given direct evidence for the 6-fold symmetry of the herpesvirus hexon capsomere. Individual hexons have been analyzed in situ without interference from other parts of the capsid because only one level of the capsid was in focus in the micrograph. This study found hexon...

We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 A resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as determined by a modified Rayleigh criterion. Point-to-point micrograph resolution between 2.5 and 3.0 ...

Influence of the stacking sequences of hybrid composites on the tensile strength, flexural strength, inter-laminar shear strength (ILSS) and impact energy was investigated. The hybrid glass-basalt-carbon/polyester composite laminates were processed by hand lay-up procedure at room temperature. The fracture surface of the composite laminates after the tension and flexural test was examined by sc...

we evaluated the effect of fe/alumina catalyst contained different cadmium contents and two synthesis temperatures on producing carbon nanotubes by chemical vapor deposition of methane as a feedstock.  x-ray powder diffraction (xrd), n2 adsorption-desorption, scanning electron microscopy (sem), transmission electron microscopy (tem), raman spectroscopy and thermogravimetry analysis (tga) were u...

The harmful effect of electromagnetic radiations emitted from VDU (video display unit) on red blood cells of Swiss albino mice, 20 cm away, at power density of 0.295 w/cm was investigated, at the interval of 7, 14, 28, 42 and 56days. The result showed altered blood smear, morphology and scanning electron micrograph of RBCs. red blood cell count, hemoglobin concentration was reduced up to day 4...