Based on a more realistic description of the in-depth secondary electron generation than that of standard (constant loss) model, a new model for the e-induced secondary electron emission yield, d = f(E), is applied to account for the observed mean atomic number dependence of the reduced yield curves (RYC), d=dmax 1⁄4 f ðE0=E0maxÞ of a wide variety of inorganic insulators. It is next used to ext...