Optical beam deflection systems are widely used in cantilever based atomic force microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the detector side to increase the reflectivity in order to achieve a high signal on the photodiode. Although the reflective coating is usually much thinner than the cantilever, it can still significantly contribute to the damping of th...

We report an approach that extends the applicability of ultrasensitive force-gradient detection of magnetic resonance to samples with spin-lattice relaxation times (T (1)) as short as a single cantilever period. To demonstrate the generality of the approach, which relies on detecting either cantilever frequency or phase, we used it to detect electron spin resonance from a T (1) = 1 ms nitroxide...

Nanoscale mechanical resonators are highly sensitive devices and, therefore, for application as highly sensitive mass balances, they are potentially superior to micromachined cantilevers. The absolute measurement of nanoscale displacements of such resonators remains a challenge, however, since the optical signal reflected from a cantilever whose dimensions are sub-wavelength is at best very wea...

A radioisotope-powered, self-oscillating cantilever beam has been developed for small scale applications. A thin beam is placed within a short distance from a radioisotope source and as the charged particles from the source are collected on the beam, it is attracted towards the source. As it contacts the source, the beam is discharged and returns to it's initial position. The period of oscillat...

Submicron cantilever structures have been demonstrated to be extremely versatile sensors and have potential applications in physics, chemistry and biology. The basic principle in submicron cantilever sensors is the measurement of the resonance frequency shift due to the added mass of the molecules bound to the cantilever surface. This paper presents a theoretical model to predict the resonance ...

Atomic force microscope (AFM) is a tool that allows micro and nano scale imaging of samples ranging from solid state physics to biology. AFM uses mechanical forces to sense the sample and recreate a topography image with high spatial resolution. The biggest disadvantage of the standard AFMs is their scanning speed, as it typically takes up to several tens of minutes to capture an image. A lot o...

A novel preamplifying cantilever (PCL) design for scanning probe microscopes (SPM) that is capable of mechanically amplifying specimen movements is presented. The sample motions in both out-of-plane and in-plane directions are amplified by the PCL. The spatial resolution of the cantilever is in the nanometer scale and is comparable with existing SPM cantilevers. Some of the proposed application...

objective: the aim of this study was to evaluate and compare the status of supporting tissue around implant-supported fixed partial denture with or without cantilever clinically and radiographically during a four-year period. materials and methods: one hundred and fifty nine patients who were treated by 482 implants supported fixed partial prosthesis with and without cantilever after at least f...

We discovered period doubling and chaos in a simulated MEMS cantilever system with electrostatic sensing and actuation, intended for a MEMS based mass storage chip, with and without servo control. We used a graphical interface for a Poincaré map method that allowed us to simulate multiple initial conditions simultaneously. We investigated both the static and dynamic instabilities of the MEMS ca...