In the present paper, digital transformation in metrology is discussed, which revolutionizing world and one of most interesting developments science & technology today. The study also discusses, how current technologies like Artificial Intelligence, Internet Things, Cloud computing, more significantly twins would become synonymous with metrology, thus bolstering future manufacturing industries....

This book presents a unique collection of chapters from world experts on patient centered outcome (PCO) measures is an open access book.

BACKGROUND A movement among international agencies and policy makers to classify industrial materials by their number content of sub-100-nm particles could have broad implications for the development of sustainable nanotechnologies. OBJECTIVES Here we highlight current particle size metrology challenges faced by the chemical industry due to these emerging number percent content thresholds, pr...

the drawing of frequency-path (f-p) models of optical beams is an approach for nonlinearity analysis in nano-metrology systems and sensors based on the laser interferometers. in this paper, the frequency-path models of four nano-metrology laser interferometry systems are designed, analyzed and simulated, including conventional and modified two- and three-longitudinal-mode laser interferometers....

There is an increasing demand from industry for intelligent reverse engineering solutions. The requirement is to be able to perform reverse engineering, to create CAD models, or to compare prototypes with CAD models. A reverse engineering solution that can be used for 6 degrees of freedom pose measurement in a large area is desired. With this application in mind, we have developed a ‘3D Probe’ ...

This study aims to determine the authority collect fees is of local governments increase regional income. Therefore mechanism for calculating tera/recalibration must be carried out as well possible and have a clear scientific basis. In determining standardization measurement weighing through standard known legal metrology. research normative juridical by taking statutory approach conceptual app...

The drawing of frequency-path (F-P) models of optical beams is an approach for nonlinearity analysis in nano-metrology systems and sensors based on the laser interferometers. In this paper, the frequency-path models of four nano-metrology laser interferometry systems are designed, analyzed and simulated, including ...

The recent proliferation of engineered surfaces, including freeform and structured surfaces, is challenging current metrology techniques. Measurement using multiple sensors has been proposed to achieve enhanced benefits, mainly in terms of spatial frequency bandwidth, which a single sensor cannot provide. When using data from different sensors, a process of data fusion is required and there is ...