نتایج جستجو برای: indirect boundary element method
تعداد نتایج: 1953766 فیلتر نتایج به سال:
The peridynamic theory brings advantages in dealing with discontinuities, dynamic loading, and nonlocality. integro-differential formulation of peridynamics poses challenges to numerical solutions complicated practical problems. Some important issues attract much attention, such as the computation infinite domains, treatment softening boundaries due an incomplete horizon, time accumulation erro...
The root of this study, comes from the lack of regularity where exists in shape function selection in direct meshless methods. In this work, we are going to establish a technique which is based on both analytical and simulated results; helps select a well-behaved shape function for which the shape parameters have been predetermined. This work has been focused on wave equation as the most import...
An efficient and highly accurate, Symmetric Galerkin Boundary Element Method Finite Element Method based alternating method, for the analysis of three-dimensional non-planar cracks, and their growth, in structural components of complicated geometries, is proposed. The crack is modeled by the symmetric Galerkin boundary element method, as a distribution of displacement discontinuities, as if in ...
The finite element method (FEM) is a domain technique of solving the underlying governing equation in the region. The solution obtained in the total region is ideal to study energy/defect interactions, but the extensive discretization demands vast computer resources. On the other hand, the potential savings in computation resources, due to a limited surface or boundary discretization, is the pr...
In this paper we describe a hybrid element method which combines the boundary element method (BEM) and the finite element method (FEM) to calculate circuit models for layout dependent capacitances. The method can handle irregularities in the stratification of the layout of the integrated circuits (IC’s). We present a stand-alone extraction program which we developed for validation and testing p...
In present-day IC’s, substrate noise can have a significant impact on performance. Thus, modeling the noise-propagation characteristics of the substrate is becoming ever more important. Two ways of obtaining such a model are the Finite Element Method (FEM) and the Boundary Element Method (BEM). The FEM makes a full 3D discretization of the entire substrate and is very accurate and flexible, but...
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