نتایج جستجو برای: field ion microscope
تعداد نتایج: 1015276 فیلتر نتایج به سال:
Based on the field emission (FE) results achieved with regular test arrays of gold [1] and platinum [2] nanowire (NW) patches, FE cathodes (Ø 5 mm) with a triangular patch array (Ø 150 μm, pitch 320 μm) of cylindrical AuNW (10 cm, Ø 200 nm, length 12 μm) were fabricated by means of a shadow mask during heavy ion irradiation of polycarbonate foils. The emitter distribution and local properties o...
Microscopy is very important in research and industry, yet traditional optical microscopy suffers from the limited field-of-view (FOV) depth-of-field (DOF) high-resolution imaging. We demonstrate a simultaneous large FOV DOF microscope imaging technology based on chip-scale metalens device that implemented by SiNx array with co- cross-polarization multiplexed dual-phase design dispersive spectr...
We have developed a simple, reliable and reproducible method for preparing single-atom tips. With electrochemical techniques, a very small amount of a noble metal is plated on the surface of a clean Wh111i tip. Upon annealing the tip at an appropriate temperature in vacuum, a three-sided {211} pyramid with a single-atom sharpness is formed spontaneously at the tip apex by adsorbate-induced face...
Resistive switching in photocross-linkable polymer memory devices was found to occur in localized areas of the device. In order to elucidate the reason behind the switching, we used focused ion-beam to prepare a cross-section of the device. It was found that after the device was switched to the high conductive state, in certain parts of the device, the electrodes were only about 5 nm apart. Thi...
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