نتایج جستجو برای: failure probability

تعداد نتایج: 580124  

2013
Peng Chen Alfio Quarteroni

Several computational challenges arise when evaluating the failure probability of a given system in the context of risk prediction or reliability analysis. When the dimension of the uncertainties becomes high, well established direct numerical methods can not be employed because of the “curse-of-dimensionality”. Many surrogate models have been proposed with the aim of reducing computational eff...

2016
Alireza Fayazi Aliakbar Aghakouchak

Article History: Received: 22 Dec. 2014 Accepted: 23 Aug. 2015 This paper presents a detailed structural reliability procedure in order to achieve an acceptable safety margin for template type offshore platforms located in the Persian Gulf. Probability of failure in this study is calculated by considering the cumulative effects of all levels of wave loading during the lifetime of the structure ...

2001
Weidong Cui

In MPLS networks, failure resilience of a Label Switched Path (LSP) is essential in guaranteeing the QoS of the path. This can be achieved by allocating backup LSPs through which packets can be routed in case of primary LSP failiures. bandwidth efficiency and expeditious path restoration are two desirable features for the design of backup LSPs. This paper tackles the bandwidth efficiency with a...

2007
Harish Agarwal Shawn E. Gano John E. Renaud Victor M. Perez Layne T. Watson

Reliability based design optimization is a methodology for finding optimized designs that are characterized with a low probability of failure. The main objective in reliability based design optimization is to minimize a merit function while satisfying the reliability constraints. The reliability constraints are constraints on the probability of failure corresponding to each of the failure modes...

2013
Jingjing Zhang Ming Ding Xianjun Qi Yi Guo

Aiming at digital relay protection system, a novel hidden failure Markov reliability model is presented for a single main protection and double main protection systems according to hidden failure and protection function under Condition-Based Maintenance (CBM) circumstance and reliability indices such as probability of protection system hidden failure state are calculated. Impacts of different p...

2003
Gaocai Wang Jianer Chen Guojun Wang

One-to-all or broadcast communication is one of the most important communication patterns and occurs in many important applications in parallel computing. In this paper, we propose a fault tolerant, local-information-based, and distributed broadcast routing algorithm based on the concept of -submesh connectivity in all-port mesh networks. We analyze the fault tolerance of our algorithm in terms...

2006
I. Mura

Assessing the safety of a structure through inspection has always been part of the practice of the structural engineer. Information obtained through these inspections can be both objective and subjective. One can update the reliability of an existing structure based on objective and subjective information through the fuzzified Bayes theorem. This paper cites the algorithm for computing the post...

2013
Il-Joon Kim Amin Khajeh Fadi J. Kurdahi Ahmed M. Eltawil

In this paper we study the impact of variability on the pulse latch. Pulse (or pulsed) latch is crucial element of the current SoC designs for both delay and power consumption. The threshold voltage (Vt) fluctuations due to Random Dopant Fluctuation (RDF) and Process, Voltage, and Temperature (PVT) effects on probability of failure are discussed. We propose a modeling methodology which is not t...

2008
Julia M. B. Braman Richard M. Murray

The control programs of complex autonomous systems that have conditional branching can be modeled as linear hybrid systems. When the state knowledge is perfect, linear hybrid systems with statebased transition conditions can be verified against a specified unsafe set using existing model checking software. This paper introduces a formal method for calculating the failure probability due to stat...

2012
Roberto Menchaca Hamid Mahmoodi

Bias temperature instability (among other problems) is a key reliability issue with nanoscale CMOS transistors. Especially in sensitive circuits such as sense amplifiers of SRAM arrays, transistor aging may significantly increase the probability of failure. By analyzing the Current Based Sense Amplifier circuit and Voltage-Latched Sense Amplifier circuit through HSPICE simulations, we observe t...

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