نتایج جستجو برای: ellipsometry

تعداد نتایج: 2054  

2017
Kewu Li Shuang Wang Liming Wang Hui Yu Ning Jing Rui Xue Zhibin Wang

In this work, a biosensing method based on in situ, fast, and sensitive measurements of ellipsometric parameters (Ψ, ∆) is proposed. Bare silicon wafer substrate is functionalized and used to bind biomolecules in the solution. Coupled with a 45° dual-drive symmetric photoelastic modulator-based ellipsometry, the parameters Ψ and ∆ of biolayer arising due to biomolecular interactions are determi...

2017
Evan L. H. Thomas Soumen Mandal John Emyr Macdonald Thomas G. Dane Jonathan Rawle Chia-Liang Cheng Oliver A. Williams

With the retention of many of the unrivaled properties of bulk diamond but in thin-film form, nanocrystalline diamond (NCD) has applications ranging from micro-/nano-electromechanical systems to tribological coatings. However, with Young’s modulus, transparency, and thermal conductivity of films all dependent on the grain size and nondiamond content, compositional and structural analysis of the...

2014
Roger Magnusson

Materials can be tailored on the nano-scale to show properties that cannot be found in bulk materials. Often these properties reveal themselves when electromagnetic radiation, e.g. light, interacts with the material. Numerous examples of such types of materials are found in nature. There are for example many insects and birds with exoskeletons or feathers that reflect light in special ways. Of ...

Journal: :The Review of scientific instruments 2010
T Hofmann C M Herzinger A Boosalis T E Tiwald J A Woollam M Schubert

We report an experimental setup for wavelength-tunable frequency-domain ellipsometric measurements in the terahertz spectral range from 0.2 to 1.5 THz employing a desktop-based backward wave oscillator source. The instrument allows for variable angles of incidence between 30 degrees and 90 degrees and operates in a polarizer-sample-rotating analyzer scheme. The backward wave oscillator source h...

2015
M. Vargas E. J. Rubio C. V. Ramana

Articles you may be interested in Optical properties of nanocrystalline WO3 and WO3-x thin films prepared by DC magnetron sputtering Dynamic in situ spectroscopic ellipsometric study in inhomogeneous TiO 2 thin-film growth Electrical and optical properties of Sn doped CuInO 2 thin films: Conducting atomic force microscopy and spectroscopic ellipsometry studies Real-time spectroscopic ellipsomet...

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