نتایج جستجو برای: efm classifier

تعداد نتایج: 44077  

Journal: :International Journal of Computer Applications 2017

Hamid Parvin, Hosein Alizadeh Mohsen Moshki

Pattern recognition systems are widely used in a host of different fields. Due to some reasons such as lack of knowledge about a method based on which the best classifier is detected for any arbitrary problem, and thanks to significant improvement in accuracy, researchers turn to ensemble methods in almost every task of pattern recognition. Classification as a major task in pattern recognition,...

2011
M. Fedias D. Saigaa

In this paper, we proposed a new fast technique of face authentication based on extraction of a simple Statistical features derived from the image of face. Once the feature vector is extracted, we comparing it with the feature vector of face which is authenticated, and we calculated the error rates in the two sets of validation and test for the data base XM2VTS according to the protocol of Laus...

2001
Kenji Yoshigoe Kenneth J. Christensen

We investigate how to add rate control to full-duplex IEEE 802.3 Ethernet. We envision the need for rate control in order to enable bandwidth allocation in future Ethernet in the First Mile (EFM) subscriber services. We propose a RATE mechanism that can be implemented with a simple byte-based leaky bucket. We demonstrate with simulation methods that RATE can isolate flows and provide lower loss...

2015
M. Labardi J. Barsotti D. Prevosto S. Capaccioli C. M. Roland R. Casalini

To improve measurements of the dielectric permittivity of nanometric portions by means of Local Dielectric Spectroscopy (LDS), we introduce an extension to current analytical models for the interpretation of the interaction between the probe tip of an electrostatic force microscope (EFM) and a thin dielectric film covering a conducting substrate. Using the proposed models, we show how more accu...

2014
Shan Wu Zilong Wu Dongdong Lin Zhenyang Zhong Zuimin Jiang Xinju Yang

Photogenerated charging properties of single Si nanorods (Si NRs) are investigated by electrostatic force microscopy (EFM) combined with laser irradiation. Under laser irradiation, Si NRs are positively charged. The amount of the charges trapped in single NRs as well as the contact potential difference between the tip and NRs' surface is achieved from an analytical fitting of the phase shift - ...

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