X-ray residual stress analysis is a well established tool for the determination of nearsurface residual stress states. If a homogeneous, macroscopically isotropic polycrystalline material is investigated using the well established standard methods of X-ray residual stress analysis like the sin21C,-method [l], the DSlle-Hauk-method [2], or the q-integral method [3] which are summarized and syste...