A numerical likelihood approach to the determination of cosmic ray anisotropies is presented which offers many advantages over other approaches. It allows a wide range of statistically meaningful hypotheses to be compared even when full sky coverage is unavailable, can be readily extended in order to include measurement errors, and makes maximum unbiased use of all available information.

Fault-localization techniques that apply statistical analyses to execution data gathered from multiple tests are quite effective when a large test suite is available. However, if no test suite is available, what is the best approach to generate one? This paper investigates the fault-localization effectiveness of test suites generated according to several test-generation techniques based on comb...

1 Currently affiliated with Intel Corporation ABSTRACT This paper presents the results for very detailed studies of pattern and timing-dependent failures from the 309 dies in the retest of an experimental test chip. 22 out of the 50 CUTs with pattern-dependent failures had test escapes if the test sets were reordered. Some timing-dependent failures became timing-independent combinational (TIC) ...

Memory testing commonly faces two issues: the characterization of detailed and realistic fault models, and the definition of time-efficient test algorithms able to detect them. Among the different types of algorithms proposed for testing Static Random Access Memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. The continuous evolution of the memory technolog...

Different test sequence selection methods, namely, the Dmethod, C-method, W-method, T-method, U-method, Uvmethod and the Wp-method, are reviewed and analysed for their fault detection capabilities. We show that the C-method and the Uv-method do not provide complete fault coverage. These seven methods are formally analysed for their fault diagnosis capabilities under single fault assumption. Amo...

Test generation complexity varies exponentially as the depth of cycles in the S-graph of the circuit. We map the hard-to-reach states obtained from a sequential test generator onto the cycles in the S-graph of the circuit. We then proceed to rank the cycles in terms of the testability gain that would result if the cycle were broken. The primary objective is not to cut all the cycles but to cut ...

Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting/propagating these target faults. Adding scan to the circuit increases reachability of these hardto-reach and/or previously unreachable states. In this paper, we postulated that fewer scan ipops are needed to make these states reachable. The states necess...

|We propose a linear complexity method to estimate robust path delay fault coverage in digital circuits. We adopt a path counting scheme for a true-value simulator that uses ags for each signal line. These ags determine the new path delay faults detected by the simulated vector pair. Experimental results are presented to show the e ectiveness of the method in estimating path delay fault coverage.

This article discusses what ethicists have called “unacceptable trade-offs” in health policy choices related to universal health coverage (UHC). Since the fiscal space is constrained, trade-offs need to be made. But some trade-offs are unacceptable on the path to universal coverage. Unacceptable choices include, among other examples from low-income countries, to expand coverage for services wit...