نتایج جستجو برای: xps technique
تعداد نتایج: 617715 فیلتر نتایج به سال:
Application specific simulation is challenging task in various real time high performance embedded devices. In this study specific application is implemented with the help of Xilinx. Xilinx provides SDK and XPS tools, XPS tools used for develop complete hardware platform and SDK provides software platform for application creation and verification. Xilinx XUP-5 board have been used and implement...
X-ray photoelectron spectroscopy (XPS) depth profiling with C60(+) sputtering was used to resolve the lithium-ion distribution in the nanometer-scale domain structures of block polymer electrolyte thin films. The electrolytes of interest are mixtures of lithium trifluoromethanesulfonate and lamellar-forming polystyrene-poly(oligo(oxyethylene)methacrylate) (PS-POEM) copolymer. XPS depth profilin...
CP titanium was polished with a colloidal silica suspension and chromic oxide slurry under low and high pressures. The polished surfaces were characterized by means of EPMA and XPS. Irrespective of polishing pressure, colloidal silica suspension successfully created a mirror-like surface that was clean at EPMA level. However, XPS detected a small amount of silicon on the outermost surface. On t...
The possibility that strongly correlated many–electron systems may exhibit spin–charge separation has generated great excitement, particularly in the light of recent experiments on low dimensional conductors and high temperature superconductors. However, finding experimental support for this hypothesis has been made difficult by the fact that most commonly used probes couple simultaneously to s...
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