نتایج جستجو برای: test equipment

تعداد نتایج: 879736  

2003

Vibration testing is widely accepted as a method to improve product quality by identifying structural weaknesses. Historically, single axis, single shaker testing is the method of choice. This is largely due to the lack of economical and effective test hardware and control software. Significant advances have been made in both arenas, resulting in test equipment design that permits multiple shak...

2002
Jiří Novák Petr Kocourek

− This paper is focused on comparison of three proposed methods for testing the modules and the complex installations of distributed systems (fieldbuses) for the use in a harsh industrial environment and applications, where the system reliability is a crucial requirement. The methods are defined, their advantages and disadvantages are explained and expected test results are presented. Special a...

Journal: :Journal of the Illuminating Engineering Institute of Japan 1993

Journal: :Periodica Polytechnica Mechanical Engineering 2013

Journal: :Journal of physics 2021

Abstract Design an automatic test control system for electric energy metering equipment to realize detection of smart meters and collection terminals. Use data processing technology, storage transmission network automated instrument analysis technology information management quality control. The realizes collection, processing, storage, transmission, summarization various businesses, provides q...

2001
Benoît Charlot Salvador Mir Fabien Parrain Bernard Courtois

A major problem for applying self-test techniques to MEMS is the multi-domain nature of the sensing parts that require special test equipment for stimuli generation. In this work we describe, for three different types of MEMS that work in different energy domains, how the required non-electrical test stimuli can be induced onchip by means of electrical signals. This provides the basis for addin...

2003
Daniela De Venuto Michael J. Ohletz Bruno Riccò

The possibility of using window comparators for the on-chip evaluation of signals in the analogue circuit part has been demonstrated and is shortly summarised. One of the problems is the lot-to-lot variation of the comparator window. An automatic window repositioning technique is detailed that allows to compensate the window shift. The components for the implementation comprising a reference co...

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