This paper presents a new approach to software reliability modeling by grouping data into clusters of homogeneous failure intensities. This series of data clusters associated with different time segments can be directly used as a piecewise linear model for reliability assessment and problem identification, which can produce meaningful results early in the testing process. The dual model fits tr...

In spite of the rich literature on software reliability growth models, it is not always easy to find correct or sufficiently detailed information on these models. As an attempt to improve upon this situation, we present a general documentation structure for software reliability growth models based on best practices from statistics. To illustrate our documentation structure, we sketch the detail...

One of the most important parameters that control reliability growth is the fault exposure ratio (FER) identi ed by Musa et al. It represents the average detectability of the faults in software. Other parameters that control reliability growth are software size and execution speed of the processor which are both easily evaluated. The fault exposure ratio thus presents a key challenge in our que...

Ÿ This paper draws on the relationship between rapid reliability growth and the trigger profile during the early part of a product’s release in the field. Ÿ Trigger distributions for the first eight quarters of a product are illustrated and compared with the software reliability growth experienced in the same period. These data illustrate the specific triggers that contributed towards the high ...

In an effort to address the continuing demand for high quality software, an enormous multitude of software reliability growth models have been proposed in recent years. In spite of the diversity and elegance of many of these, there is still a need for models which can be more readily applied in practice. One aspect which should perhaps be taken more account of is the complex and challenging nat...

Nonhomogeneous poisson process based software reliability growth models are generally classified into two groups. The first group contains models, which use the machine execution time or calendar time as a unit of fault detection/removal period. Such models are called continuous time models. The second group contains models, which use the number of test occasions/cases as a unit of fault detect...

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In the development of software reliability measurement and prediction, many software reliability growth models have been proposed. Application of these models to real data sources has shown that there is commonly great disagreement in predictions, while none of them has been shown to be more trustworthy than others in terms of predictive quality in all applications. In this paper, we shall use ...

In this paper, we first show that the logistic testing-effort function is practically acceptable/helpful for modeling software reliability growth and providing a reasonable description of resource consumption. Therefore, in addition to the exponential-shaped models, we will integrate the logistic testing-effort function into S-shaped model for further analysis. The model is designated as the Ya...