Abstract Electron beam lithography (EBL) on non-planar, suspended, curved or bent surfaces is still one of the most frequently stated problems for fabricating novel and innovative nano-devices sensors future technologies. Although spin coating widespread technique electron resist (e-resist) deposition 2D flat surfaces, it inadequate suspended 3D architectures because its lack uniformity. In thi...

We discuss several recent advances in the development of methodologies and techniques used to structurally morphologically engineer chalcogenide (ChG) materials. introduce two ChG patterning both offering spatial resolution beyond classical single-photon diffraction limit: multiphoton lithography thermal scanning probe (TSPL). The former was applied produce nanoscale modifications thermally dep...

Scanning probe recognition microscopy is a new scanning probe microscopy technique which enables selective scanning along individual nanofibers within a tissue scaffold. Statistically significant data for multiple properties can be collected by repetitively fine-scanning an identical region of interest. The results of a scanning probe recognition microscopy investigation of the surface roughnes...

Scanning probe microscopy (SPM) is emerging as an important alternative to electron microscopy as a technique for analyzing submicron details on biological surfaces. Microbiological specimens such as viruses, bacteriophages, and ordered bacterial surface layers and membranes have played an important role in the development of scanning tunnelling microscopy (STM) and atomic force microscopy (AFM...

Today’s research laboratory is required to solve difficult problems that span multiple disciplines. Advanced techniques are required to answer pressing questions related to adhesion, bonding, contamination and surface cleanliness, corrosion, surface morphology, surface roughness, surface topography, failure analysis, process monitoring, surface chemistry, biological characterization, local surf...

Probe-corrected spherical near-field antenna measurements with an arbitrary probe set certain requirements on an applicable scanning technique. The computational complexity of the general high-order probe correction technique for an arbitrary probe, that is based on the scanning, is , where is proportional to the radius of the antenna under test (AUT) minimum sphere in wavelengths. With the pre...

Atomic Force Microscopy (AFM) has rapidly gained widespread utilization as an imaging device and micro/nano-manipulator during recent years. This thesis investigates the new concept of a dual stiffness scanning probe with respect to biological applications and determines the resulting requirements for the scanning of soft bio samples, such as lowpressure contact. On this basis, an in-plane AFM ...

Scanning probe microscopes are widely used to study surfaces with atomic resolution in many areas of nanoscience. Ultracold atomic gases trapped in electromagnetic potentials can be used to study electromagnetic interactions between the atoms and nearby surfaces in chip-based systems. Here we demonstrate a new type of scanning probe microscope that combines these two areas of research by using ...