In the field of failure analysis of integrated circuits, diagnosing functional failures is a requirement. Traditional beam-based analysis techniques use a scanning laser or e-beam to induce a parametric shift which is monitored through changes in current or voltage driven to the device. Deep submicron technologies frustrate these analytical methods due to the nearly immeasurable parametric shif...

background: ovarian pregnancy is a rare form of the non-tubal ectopic pregnancy. it ends with rupture before the end of the first trimester. one of the important risk factors for ovarian pregnancy is in the use of intra uterine devices (iud). case:  we report here one such uncommon case of ovarian ectopic pregnancy. our patient is a 30 years old multiparous woman with two previous cesarean sect...

background: precise diagnosis of disease risk factors via efficient statistical models is the primary step for reducing the heavy costs of breast cancer, as one of the most highly prevalent cancer throughout the world. therefore, the aim of this study was to present a recently introduced statistical model in order to assess its proficiency for model fitting. methods: the information of 1465 eli...

In nanometer scale static-RAM (SRAM) arrays, systematic inter-die and random within-die variations in process parameters can cause significant parametric failures, severely degrading parametric yield. In this paper, we investigate the interaction between the inter-die and intra-die variations on SRAM read and write failures. To improve the robustness of the SRAM cell, we propose closed-loop ada...

Due to their unique properties as lossless, nonlinear circuit elements, Josephson junctions lie at the heart of superconducting quantum information processing. Previously, we demonstrated a two-layer, submicrometer-scale overlap junction fabrication process suitable for qubits with long coherence times. Here, extend micrometer-scale junctions. This allows us fabricate other devices. For example...

The major goal of our work was to develop an efficient defect-oriented parametric test method for analog & mixed-signal integrated circuits based on Artificial Neural Network (ANN) classification of a selected circuit’s parameter using different methods of signal preprocessing. Thus, ANN has been used for detecting catastrophic defects in an experimental mixedsignal CMOS circuits by sensing the...

Nonlinear silicon photonics has been an immense research subject in the past several years with promising prospects of delivering chip scale signal modulation, shaping and characterization tools. In particular, broadband parametric process has been considered for applications ranging from wideband light amplifiers to signal characterization and signal shaping tools. Although underlying nonlinea...

abstractbackgroundline of treatment for management of hydrocephalus despite available new techniques andsystems of shunting. associated complications should be recognized and managed properly,but the most recognized complications are shunt obstruction which its prevalencethrough surgical approach is discussed here. two approaches (frontal and parietal) are usedto insert ventriculoperitoneal shu...

results the mean age and work experience of workers were 31.39 ± 5.6 and 4.35 ± 2.5 years, respectively. among the exposed-to-noise personnel, 7.35% used hpds constantly; 75% used hpds for only short periods of time (less than four hours) and 17.65% did not make use of them at all. regarding the sound intensity and the level of noise reduction of hpds, among the 112 workers who used such device...