This paper presents segmented addressable scan (SAS), a test architecture that addresses test data volume, test application time, test power consumption, and tester channel requirements using a hardware overhead of a few gates per scan chain. Using SAS, this paper also presents systematic scan reconfiguration, a test data compression algorithm that is applied to achieve 10× to 40× compression r...

Due to the difficulty of test pattern generation for sequential circuits, several design-for-testability (DFT) approaches have been proposed. An improvement to these current approaches is needed to cater to the requirements of today’s more complicated chips. This paper introduces a new DFT method applicable to high-level description of circuits, which optimally utilizes existing functional elem...

The modeling of the historical architecture can be characterized by different levels geometric development, more or less advanced, which correspond to values deviation between real object and its three-dimensional representation. aim paper is a critical study geometry (LoG) that architectural elements model have in relation efforts required achieve them objectives. More specifically, contributi...